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DC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD

外国特許コード F130007303
整理番号 S2011-1084-N0
掲載日 2013年4月17日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2012JP074599
国際公開番号 WO 2013/047537
国際出願日 平成24年9月25日(2012.9.25)
国際公開日 平成25年4月4日(2013.4.4)
優先権データ
  • 特願2011-210008 (2011.9.26) JP
発明の名称 (英語) DC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD
発明の概要(英語)

This DC magnetic field magnetic profile measuring device obtains magnetic field distribution images on the surface of an observation sample using magnetic field amplitude and phase data obtained by scanning a scanning region. This magnetic profile measuring device (1) is provided with a cantilever (11), an exciter (12) which excites the cantilever at the resonant frequency or a frequency close thereto, an AC magnetic field generator (13) which frequency-modulates the excitation frequency of the cantilever, a vibration sensor (14) which detects vibration by means of a probe, a demodulation processing device (15) which demodulates the magnetic signal corresponding to the AC magnetic force generated between the probe and the observation sample and detects the amplitude and phase of the magnetic field, a scanning mechanism (16) which scans the scanning region with the probe, a data storage device (17) which stores as initial data the amplitude and phase of the magnetic field at each coordinate of the scanning region, a modified data generator (18) which, from the initial data, generates data with a modified phase, and an image display device (19) which displays a magnetic field distribution image based on the changed data.

  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • AKITA UNIVERSITY
  • 発明者(英語)
  • SAITO HITOSHI,
  • YOSHIMURA SATORU
国際特許分類(IPC)
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