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AC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD

外国特許コード F130007304
整理番号 S2011-1198-N0
掲載日 2013年4月17日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2012JP074600
国際公開番号 WO 2013/047538
国際出願日 平成24年9月25日(2012.9.25)
国際公開日 平成25年4月4日(2013.4.4)
優先権データ
  • 特願2011-210009 (2011.9.26) JP
発明の名称 (英語) AC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD
発明の概要(英語)

By scanning a space where an AC magnetic field is present, this AC magnetic field magnetic profile measuring device measures the magnetic profile of said space and the magnetic profile of an AC magnetic field generating device. This AC magnetic field magnetic profile measuring device is provided with a cantilever (11) at the end of which a probe is mounted, an exciter (12) which excites at the resonant frequency of the cantilever or a frequency close thereto, a vibration sensor (13) which detects vibration by means of the probe, a demodulation processing device (14) which demodulates the magnetic signal corresponding to the AC magnetic field at the position of the probe and separates the demodulated magnetic signal into the two orthogonal signal components differing in phase by 90 DEG , a scanning mechanism (15)

which scans the space where the demodulated magnetic signal is present with the probe, a data storage device which stores the two orthogonal signal components as initial data with unchanged initial phases, a modified data generator which reads in the initial data stored in the data storage device and generates data in which the phases of the initial data have been modified, and an image display device which displays a magnetic field distribution image.

  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • AKITA UNIVERSITY
  • 発明者(英語)
  • SAITO HITOSHI,
  • YOSHIMURA SATORU
国際特許分類(IPC)
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