TOP > 外国特許検索 > POLARIZED WAVE ANALYZER, POLARIZED WAVE ANALYSIS METHOD, PHYSICAL PROPERTY MEASUREMENT DEVICE, AND PHYSICAL PROPERTY MEASUREMENT METHOD

POLARIZED WAVE ANALYZER, POLARIZED WAVE ANALYSIS METHOD, PHYSICAL PROPERTY MEASUREMENT DEVICE, AND PHYSICAL PROPERTY MEASUREMENT METHOD

外国特許コード F130007400
整理番号 S2012-0030-N0
掲載日 2013年6月12日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2012JP076146
国際公開番号 WO 2013/077097
国際出願日 平成24年10月9日(2012.10.9)
国際公開日 平成25年5月30日(2013.5.30)
優先権データ
  • 特願2011-258104 (2011.11.25) JP
発明の名称 (英語) POLARIZED WAVE ANALYZER, POLARIZED WAVE ANALYSIS METHOD, PHYSICAL PROPERTY MEASUREMENT DEVICE, AND PHYSICAL PROPERTY MEASUREMENT METHOD
発明の概要(英語)

Provided is a polarized wave analyzer that can measure polarized wave orientation and electric field amplitudes for electromagnetic waves with high speed and high precision. The polarized wave analyzer has: an electromagnetic wave generation source that generates electromagnetic waves

a nonlinear optical crystal that has an electrooptic effect

a rotating mechanism that rotates the crystal relative to the incidence of electromagnetic waves at an angular frequency (omega)

an optical system that makes a probe light pulse incident to the crystal in synchrony with irradiation of the crystal by the electromagnetic waves

a detector that detects an intensity differential signal for light components that are orthogonal to each other out of the probe light pulse that has passed through the crystal

and an analytical unit that extracts at least one of the omega component and the 3omega component from the intensity differential signal and determines the polarized wave orientation and the amplitude of the electromagnetic field for the electromagnetic waves on the basis of the extracted omega component and/or the 3omega component.

  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • KEIO UNIVERSITY
  • 発明者(英語)
  • WATANABE, SHINICHI,
  • YASUMATSU, NAOYA
国際特許分類(IPC)
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