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MICROCRYSTAL STRUCTURE ANALYSIS DEVICE, MICROCRYSTAL STRUCTURE ANALYSIS METHOD, AND X-RAY SHIELD DEVICE

外国特許コード F130007663
整理番号 S2012-0390-N0
掲載日 2013年10月17日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2013JP052704
国際公開番号 WO 2013/118761
国際出願日 平成25年2月6日(2013.2.6)
国際公開日 平成25年8月15日(2013.8.15)
優先権データ
  • 特願2012-023212 (2012.2.6) JP
発明の名称 (英語) MICROCRYSTAL STRUCTURE ANALYSIS DEVICE, MICROCRYSTAL STRUCTURE ANALYSIS METHOD, AND X-RAY SHIELD DEVICE
発明の概要(英語)

Provided are a microcrystal structure analysis device, a microcrystal structure analysis method, and an x-ray shield device, with which it is possible to obtain a favorable x-ray diffraction image even when illuminating a pseudo-single crystal sample with x-rays while rotating same. This microcrystal structure analysis device (1) comprises: a magnetic field emission unit (12)

a sample drive unit (13) which rotates, with respect to the magnetic field emission unit (12), a sample container (2), which houses a sample in which microcrystals (3) are suspended, such that a magnetic field which fluctuates temporally is applied to the sample container (2) and the microcrystals (3) are three-dimensionally oriented

an x-ray source (21) which illuminates the sample container (2), which is being rotated by the sample drive unit (13), with an x-ray (a)

an x-ray detector unit (23) which is capable of detecting x-rays (a) which pass through and are diffracted by the sample container (2)

and a state switch device (G) which switches, according to the rotation location of a specific site (2a) which is a portion of the sample container (2) in the rotation direction, between a state in which the x-rays (a) cannot be detected by the x-ray detector unit (23) and a state in which the x-rays (a) can be detected by the x-ray detector unit (23).

  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • KYOTO UNIVERSITY
  • 発明者(英語)
  • KIMURA, TSUNEHISA,
  • KIMURA, FUMIKO,
  • TSUBOI, CHIAKI
国際特許分類(IPC)
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