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DEVICE FOR MEASURING OXIDATION-REDUCTION POTENTIAL AND METHOD FOR MEASURING OXIDATION-REDUCTION POTENTIAL

外国特許コード F140007975
整理番号 S2012-1005-C0
掲載日 2014年9月26日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2013JP071723
国際公開番号 WO 2014025044
国際出願日 平成25年8月9日(2013.8.9)
国際公開日 平成26年2月13日(2014.2.13)
優先権データ
  • 特願2012-177909 (2012.8.10) JP
発明の名称 (英語) DEVICE FOR MEASURING OXIDATION-REDUCTION POTENTIAL AND METHOD FOR MEASURING OXIDATION-REDUCTION POTENTIAL
発明の概要(英語) Provided is a small-sized device for measuring an oxidation-reduction potential, whereby an oxidation-reduction current and an oxidation-reduction potential can be measured by reducing noise even when a signal from a solution being measured is small. A device for measuring an oxidation-reduction potential is provided with a substrate (10), a working electrode (15) mounted on a surface of the substrate (10), and a bipolar transistor (21) for amplifying the output of the working electrode (15) also provided on the surface of the substrate (10), and the signal amplified by the bipolar transistor (21) is inputted to a processing circuit (18).
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • TOYOHASHI UNIVERSITY OF TECHNOLOGY
  • 発明者(英語)
  • FUTAGAWA MASATO
  • SAWADA KAZUAKI
  • TAKAHASHI SOU
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IS JP KE KG KN KP KR KZ LA LC LK LR LS LT LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN TD TG
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