TOP > 外国特許検索 > METHOD FOR PREPARING CRYSTAL STRUCTURE ANALYSIS SAMPLE, METHOD FOR DETERMINING MOLECULAR STRUCTURE OF ORGANIC COMPOUND, AND DEVICE FOR PREPARING CRYSTAL STRUCTURE ANALYSIS SAMPLE

METHOD FOR PREPARING CRYSTAL STRUCTURE ANALYSIS SAMPLE, METHOD FOR DETERMINING MOLECULAR STRUCTURE OF ORGANIC COMPOUND, AND DEVICE FOR PREPARING CRYSTAL STRUCTURE ANALYSIS SAMPLE

外国特許コード F150008091
整理番号 AF11-07WO
掲載日 2015年1月23日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2013JP056371
国際公開番号 WO 2014038221
国際出願日 平成25年3月7日(2013.3.7)
国際公開日 平成26年3月13日(2014.3.13)
優先権データ
  • 特願2012-197911 (2012.9.7) JP
  • 特願2012-270199 (2012.12.11) JP
発明の名称 (英語) METHOD FOR PREPARING CRYSTAL STRUCTURE ANALYSIS SAMPLE, METHOD FOR DETERMINING MOLECULAR STRUCTURE OF ORGANIC COMPOUND, AND DEVICE FOR PREPARING CRYSTAL STRUCTURE ANALYSIS SAMPLE
発明の概要(英語) The present invention provides: a method that is for preparing a crystal structure analysis sample resulting from an organic compound molecule that determines molecular structure being regularly arranged within hollows and minute pores within a monocrystal of a polymer complex having a 3D network structure containing a metal ion as a central metal and a ligand having at least two ligating sites, and that is characterized by having a step for immersing the monocrystal of a polymer complex in a solvent solution containing the organic compound, and then vaporizing the solvent under moderate conditions, thus concentrating the solvent solution; a method for determining the molecular structure of an organic compound and characterized by performing crystal structure analysis of the organic compound using a crystal structure analysis sample obtained by means of the method for preparing; and a device for preparing a crystal structure analysis sample. By means of the present invention, provided are: a method for preparing a crystal structure analysis sample useful when determining the molecular structure of a minute quantity of an organic compound; a method for determining the molecular structure of an organic compound; and a device for preparing a crystal structure analysis sample.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • 発明者(英語)
  • FUJITA MAKOTO
  • INOKUMA YASUHIDE
  • YOSHIOKA SHOTA
  • ARIYOSHI JUNKO
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IS JP KE KG KM KN KP KR KZ LA LC LK LR LS LT LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG
参考情報 (研究プロジェクト等) CREST Development of the Foundation for Nano-Interface Technology AREA
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