TOP > 外国特許検索 > DYNAMIC ANALYSIS METHOD FOR POLYMER CHAIN, MANUFACTURING METHOD FOR POLYMER, POLYMER, MANUFACTURING METHOD FOR SYNTHETIC POLYMER, AND SYNTHETIC POLYMER

DYNAMIC ANALYSIS METHOD FOR POLYMER CHAIN, MANUFACTURING METHOD FOR POLYMER, POLYMER, MANUFACTURING METHOD FOR SYNTHETIC POLYMER, AND SYNTHETIC POLYMER

外国特許コード F150008186
掲載日 2015年3月23日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2013JP084818
国際公開番号 WO 2014104172
国際出願日 平成25年12月26日(2013.12.26)
国際公開日 平成26年7月3日(2014.7.3)
優先権データ
  • 特願2012-283897 (2012.12.27) JP
  • 特願2013-086164 (2013.4.17) JP
発明の名称 (英語) DYNAMIC ANALYSIS METHOD FOR POLYMER CHAIN, MANUFACTURING METHOD FOR POLYMER, POLYMER, MANUFACTURING METHOD FOR SYNTHETIC POLYMER, AND SYNTHETIC POLYMER
発明の概要(英語) Provided is a method for analyzing the dynamic state of a single polymer chain using a high-speed atomic force microscope or an atomic force microscope in order to clarify the structure-property relationship of a polymer material, and the like. Also provided are a manufacturing method for a polymer using this dynamic analysis method, a polymer manufactured by this manufacturing method, a manufacturing method for a synthetic polymer using this dynamic analysis method, and a synthetic polymer manufactured by this manufacturing method. This dynamic analysis method for a single polymer chain is provided with: a step for acquiring a dynamic image of the single polymer chain; a step for selecting an arbitrarily defined image among static images constituting the dynamic image; a step for numbering a plurality of portions of the single polymer chain using the selected static image; a step for performing displacement measurement of the numbered portions for each of the static images; and a step for, on the basis of the displacement measurement values of the numbered portions, calculating at least one among the movement amount, movement speed, movement acceleration, angle formed by three points, and diffusion coefficient of each of the portions.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY
  • 発明者(英語)
  • SHINOHARA KEN-ICHI
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KN KP KR KZ LA LC LK LR LS LT LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN TD TG
※ 上記の特許・技術に関心のある方は、下記問合せ先にご相談下さい。

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