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X-RAY CT IMAGE PROCESSING METHOD, X-RAY CT IMAGE PROCESSING PROGRAM, AND X-RAY CT IMAGE DEVICE

外国特許コード F150008255
掲載日 2015年3月27日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2014JP002571
国際公開番号 WO 2014185078
国際出願日 平成26年5月15日(2014.5.15)
国際公開日 平成26年11月20日(2014.11.20)
優先権データ
  • 特願2013-102646 (2013.5.15) JP
発明の名称 (英語) X-RAY CT IMAGE PROCESSING METHOD, X-RAY CT IMAGE PROCESSING PROGRAM, AND X-RAY CT IMAGE DEVICE
発明の概要(英語) This invention provides an X-ray CT image processing method that allows more flexible expression by expressing X-ray absorption coefficients probabilistically, makes it possible to acquire reconstructed images that are comparable to those obtained by conventional methods but involve lower X-ray doses, and can reduce beam-hardening artifacts. A probability distribution for the observation of projected X-rays is set and statistical inference is performed. Said probability distribution is expressed in terms of the process of observing a multiple-X-ray sum resulting from multiple projected X-rays being incident upon a detector. Said multiple-X-ray sum is expressed in terms of a plurality of X-rays with different wavelengths and spatial positions and directions being incident upon the detector as a result of the fact that the X-ray detection surface of the detector is not a single point in space but rather has a given area, the fact that the X-ray detection period of the detector is not a single instant but rather has a given duration, and the fact that the spectral distribution of the X-rays is not a line spectrum but rather has a given spread. Bayesian inference in which the expected value of the posterior distribution is used for statistical inference is performed on the basis of a prior distribution for X-ray absorption coefficients, said prior distribution having parameters for the material and the observation process in terms of which the multiple-X-ray sum is expressed.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • KYOTO UNIVERSITY
  • 発明者(英語)
  • MAEDA SHINICHI
  • YOSHIKAWA DAIGO
  • TANAKA TAKUMI
  • ISHII SHIN
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KN KP KR KZ LA LC LK LR LS LT LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN TD TG
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