TOP > 外国特許検索 > METHOD FOR PREPARING TEST SAMPLE FOR CRYSTAL STRUCTURE ANALYSIS, AND METHOD FOR DETERMINING MOLECULAR STRUCTURE OF ORGANIC COMPOUND HAVING FUNCTIONAL GROUP

METHOD FOR PREPARING TEST SAMPLE FOR CRYSTAL STRUCTURE ANALYSIS, AND METHOD FOR DETERMINING MOLECULAR STRUCTURE OF ORGANIC COMPOUND HAVING FUNCTIONAL GROUP

外国特許コード F150008521
整理番号 AF11-12WO
掲載日 2015年11月19日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2015JP056635
国際公開番号 WO 2015137246
国際出願日 平成27年3月6日(2015.3.6)
国際公開日 平成27年9月17日(2015.9.17)
優先権データ
  • 特願2014-046707 (2014.3.10) JP
発明の名称 (英語) METHOD FOR PREPARING TEST SAMPLE FOR CRYSTAL STRUCTURE ANALYSIS, AND METHOD FOR DETERMINING MOLECULAR STRUCTURE OF ORGANIC COMPOUND HAVING FUNCTIONAL GROUP
発明の概要(英語) The present invention provides a method for preparing a test sample for crystal structure analysis, for the purpose of determining the molecular structure of an organic compound (A) having a functional group (a), wherein the method for preparing a test sample for crystal structure analysis is characterized by having a step for bringing about contact between a solvent solution containing the organic compound (A), and a monocrystal of a porous compound having a three-dimensional skeleton constituted by one or more molecular chains, or by one or more molecular chains and a skeleton-forming compound, and pores and/or voids which are formed through partitioning by the three-dimensional skeleton and which are arrayed three-dimensionally in a regular arrangement, the three-dimensional skeleton containing within the pores and/or voids thereof a functional group (b) that interacts with the functional group (a), whereby the molecules of the organic compound (A) become arranged in a regular manner within the pores and/or voids of the monocrystal; and a method for determining the molecular structure of an organic compound having a functional group, which employs the test sample for crystal structure analysis obtained by this method.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • 発明者(英語)
  • FUJITA MAKOTO
  • INOKUMA YASUHIDE
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KN KP KR KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN TD TG
参考情報 (研究プロジェクト等) CREST Development of the Foundation for Nano-Interface Technology AREA
ライセンスをご希望の方、特許の内容に興味を持たれた方は、問合せボタンを押してください。

PAGE TOP

close
close
close
close
close
close