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ELECTRIC FORCE AND MAGNETIC FORCE MICROSCOPE AND SIMULTANEOUS ELECTRIC FIELD AND MAGNETIC FIELD MEASUREMENT METHOD

外国特許コード F150008547
整理番号 (S2014-0359-N0)
掲載日 2015年11月25日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2015JP052766
国際公開番号 WO 2015115622
国際出願日 平成27年1月30日(2015.1.30)
国際公開日 平成27年8月6日(2015.8.6)
優先権データ
  • 特願2014-016131 (2014.1.30) JP
発明の名称 (英語) ELECTRIC FORCE AND MAGNETIC FORCE MICROSCOPE AND SIMULTANEOUS ELECTRIC FIELD AND MAGNETIC FIELD MEASUREMENT METHOD
発明の概要(英語) An electric force and magnetic force microscope (1) provided with: a probe member (11) having a soft magnetic probe (112); a probe excitation unit (12) for exciting the probe member (11); an alternating electric field application unit (131) and an alternating magnetic field application unit (132) for applying an alternating electric field and an alternating magnetic field having different frequencies to the soft magnetic probe (112); an alternating electric field driving unit (141) and an alternating magnetic field driving unit (142) for driving the alternating electric field application unit (131) and the alternating magnetic field application unit (132); a probe vibration detection unit (15) for detecting the vibration of the probe member (11) and generating a vibration detection signal (VIB); a probe scanning unit (16) for scanning a sample (SMPL) using the soft magnetic probe (112); a demodulation unit (17) for acquiring the vibration detection signal (VIB) and demodulating the alternating electric force and alternating magnetic force generated between the sample (SMPL) and the soft magnetic probe (112); an electric field measurement unit (181) for using the demodulated alternating electric force to measure the electric field generated by the sample (SMPL); and a magnetic field measurement unit (182) for using the demodulated alternating magnetic force to measure the magnetic field generated by the sample (SMPL).
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • AKITA UNIVERSITY
  • 発明者(英語)
  • SAITO HITOSHI
  • YOSHIMURA SATORU
  • KINOSHITA YUKINORI
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KN KP KR KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN TD TG
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