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CHIP FOR ELECTRICAL MEASUREMENT, AND ELECTRICAL MEASURING DEVICE

外国特許コード F160008793
整理番号 (NU-0550)
掲載日 2016年8月4日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2015JP079532
国際公開番号 WO 2016063858
国際出願日 平成27年10月20日(2015.10.20)
国際公開日 平成28年4月28日(2016.4.28)
優先権データ
  • 特願2014-214090 (2014.10.20) JP
  • 特願2015-078223 (2015.4.7) JP
発明の名称 (英語) CHIP FOR ELECTRICAL MEASUREMENT, AND ELECTRICAL MEASURING DEVICE
発明の概要(英語) Provided are a chip for electrical measurement, which is designed for high-sensitivity detection by reading not only changes in steady-state current, but the occurrence of transient current as well; and an electrical measurement device that includes the chip for electrical measurement. This chip for electrical measurement includes a substrate, and a sample migration channel and a sample measurement channel which are formed on the substrate. The sample measurement channel includes a first measurement channel that connects to the sample migration channel, and a second measurement channel that connects to the sample migration channel at the opposite side from the first measurement channel.
特許請求の範囲(英語) [claim1]
1.  Wherein the substrate, the sample transfer channel formed on the substrate and the sample measurement channel,  The sample measurement channel is first measurement channel to be connected to the sample transfer channel, and said first measurement channel comprises a second measurement channel to be connected from the opposite side to said sample transfer channel, Electrical measurement for chip.
[2]
[claim2]
2.  The width of the first measurement channel and the second measurement channel is, the more the length of the portion that is connected to the sample transfer channel, according to claim 1 comprising longer as the distance from the sample transfer channel electric measurement chip.
[3]
[claim3]
3.  The first measurement channel and the second measurement channel is, for electric measurement chip according to claim 1 or 2 is formed asymmetrically positions across the sample transfer channel.
[4]
[claim4]
4.  The sample narrowed portion in the moving passage for electric measurement chip according to any one of claims 1 to 3, which is formed at least one or more.
[5]
[claim5]
5.  The sample transfer channel sample introduction channel formed in one end of said containing the sample transfer channel sample collection channel formed in the other end of the electrical measurement according to any one of claims 1 to 4 use chip.
[6]
[claim6]
6.  The first measurement channel and place of the second measurement channel, the first measurement electrode and the second one for electric measurement chip according to one of claims 1 to 5, the measuring electrode is formed.
[7]
[claim7]
7.  Electrical measurement chip according to any one of claims 1 to 5,  A driving circuit for the sample to be able to move the sample transfer channel,  Measurement circuit applies a voltage to the first measurement channel and a second measurement channel, the sample to measure the change in current when moving sample moving circuit, Electrical measurement device including a.
[8]
[claim8]
8.  Electrical measurements according to claim 6 for the chip,  A driving circuit for the sample to be able to move the sample transfer channel,  Measurement circuit applies a voltage to the first measurement electrode and the second measurement electrode, the sample to measure a change in current when moving sample moving circuit, Electrical measurement device including a.
[9]
[claim9]
9.  The measurement circuit includes a variable resistor for the state of the resistance balanced with the drive circuit and the measuring circuit,  Said measurement circuit, the electrical measuring device according to claim 7 or 8 for measuring the difference between the current from the balanced state.
[10]
[claim10]
10.  Said measurement circuit, the electrical measuring device according to any one of claims 7-9 for measuring the change of the transient current and the steady-state current.
[11]
[claim11]
11.  Electrical measurement device according to any one of claims 7-10, further comprising a fluorescent microscope.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NAGOYA UNIVERSITY
  • OSAKA UNIVERSITY
  • 発明者(英語)
  • BABA YOSHINOBU
  • KAJI NORITADA
  • YASUI TAKAO
  • YASAKI HIROTOSHI
  • SANO MAMIKO
  • KAWAI TOMOJI
  • YANAGIDA TAKESHI
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KN KP KR KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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