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THREE-DIMENSIONAL MEASUREMENT SYSTEM, THREE-DIMENSIONAL MEASUREMENT METHOD, AND THREE-DIMENSIONAL MEASUREMENT PROGRAM

外国特許コード F170008945
整理番号 (S2015-1503-N0)
掲載日 2017年2月1日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2016JP065084
国際公開番号 WO 2016186211
国際出願日 平成28年5月20日(2016.5.20)
国際公開日 平成28年11月24日(2016.11.24)
優先権データ
  • 特願2015-103366 (2015.5.21) JP
発明の名称 (英語) THREE-DIMENSIONAL MEASUREMENT SYSTEM, THREE-DIMENSIONAL MEASUREMENT METHOD, AND THREE-DIMENSIONAL MEASUREMENT PROGRAM
発明の概要(英語) A three-dimensional measurement system (100) for estimating the depth of a measurement object (4) on which a two-dimensional pattern is projected by projection light via a projection optical system, by comparing image data captured and obtained by a camera (2) and a reference image data group correlated with the depth of the measurement object (4) and acquired in advance. The two-dimensional pattern is projected on the measurement object (4) via a coded aperture pattern provided to the projection optical system. The depth of the measurement object (4) is estimated by image processing in which a stereo method for performing image matching based on a parallax of the projection optical system and an imaging means with respect to the measurement object (4), and a DfD method based on blur in the optical axis direction of the coded aperture pattern in the image data of the measurement object (4) are both applied.
特許請求の範囲(英語) [claim1]
1. Through projection optical system, with projection light with image pickup expedient, image pickup doing measurement object ones where 2 dimensional pattern is projected, being 3 dimensional measurement system which presumes the depth of aforementioned measurement object ones by comparing with the graphics data which can and the reference graphics data group which the corresponding attaching and others [re] te beforehand is acquired, in depth of aforementioned measurement object ones,
As for the aforementioned 2 dimensional pattern through the coded opening pattern which is provided in the aforementioned projection optical system as it is projected to aforementioned measurement object ones,
As for depth of aforementioned measurement object ones, 3 dimensional measurement system which features that it is presumed by the image processing which applies both parties of the DfD method which is based on the stereo law and the becoming dim of optical axis direction does picture matching which is based on the aforementioned projection optical system and the parallax for aforementioned measurement object ones of the aforementioned image pickup expedient of the aforementioned coded opening pattern which in the graphics data of aforementioned measurement object ones.
[claim2]
2. As for the aforementioned reference graphics data group, image pickup doing with the aforementioned image pickup expedient, it is the graphics data which was calculated by the graphics data or the simulation which can,
In the claim 1 which features thing 3 dimensional measurement system of statement.
[claim3]
3. As for the aforementioned reference graphics data group, when making 2 dimensional plane surface plural positions on the optical axis of the aforementioned projection light, image pickup doing with the respective aforementioned image pickup expedient, it includes the graphics data of the aforementioned 2 dimensional plane surface which can,
In the claim 2 which features thing 3 dimensional measurement system of statement.
[claim4]
4. The aforementioned 2 dimensional plane surface is orthogonal in the optical axis of the aforementioned projection optical system,
In the claim 3 which features thing 3 dimensional measurement system of statement.
[claim5]
5. As for the aforementioned reference graphics data group,
In the optical axis of the aforementioned projection optical system 2 dimensional plane surface which slanted intersection is done, when putting respectively with the angle where plural differs vis-a-vis the aforementioned optical axis, the graphics data of 2 dimensional slope which is obtained is included,
In the claim 3 which features thing 3 dimensional measurement system of statement.
[claim6]
6. As for graphics data of the aforementioned 2 dimensional slope,
It is drawn up is done with the image pickup section by synthesizing the reference graphics data of the aforementioned 2 dimensional plane surface which image pickup partly,
In the claim 5 which features thing 3 dimensional measurement system of statement.
[claim7]
7. The aforementioned picture matching is done making use of the matching window,
In the claim 1 which features thing 3 dimensional measurement system of statement.
[claim8]
8. As for the aforementioned 2 dimensional pattern possessing the projection pattern where plural differs,
Without doing opposite convoluted operation, with the 1st projection pattern which forms the aforementioned 2 dimensional pattern as the search range of depth direction is decided,
The aforementioned 2 dimensional pattern is formed, depth of aforementioned measurement object ones is presumed making use of the hierarchical restoration method of the picture due to doing opposite convoluted operation the aforementioned 1st projection pattern with the 2nd projection pattern which differs, in the aforementioned search range,
From the claim 1 which features thing either of claim 7 in one section 3 dimensional measurement system of statement.
[claim9]
9. Combination of the aforementioned 2 dimensional pattern and the aforementioned coded opening pattern, the line pattern line which optically lines up into the same direction, the dot pattern which is arranged into 2 dimensional condition, is either of combination with the aforementioned line pattern line and the aforementioned dot pattern, at least as for one side of the aforementioned 2 dimensional pattern and the aforementioned coded opening pattern is irregular random pattern,
From the claim 1 which features thing either of claim 8 in one section 3 dimensional measurement system of statement.
[claim10]
10. In the aforementioned 2 dimensional pattern,
The 1st 2 dimensional pattern group which was formed by 1st color and,
It is formed 2nd by color, the description above the 2nd 2 dimensional pattern group where 1st the spatial frequency component is higher than 2 dimensional pattern group and,
Is included,
From the claim 1 which features thing either of claim 9 in one section 3 dimensional measurement system of statement.
[claim11]
11. In the aforementioned 2 dimensional pattern,
The 1st line pattern group which was formed by 1st color and,
The 2nd line pattern group which are formed by 2nd color and the aforementioned 1st line pattern group and crosses and,
Is included,
From the claim 1 which features thing either of claim 9 in one section 3 dimensional measurement system of statement.
[claim12]
12. In the aforementioned coded opening pattern,
The 1st coded opening pattern which has the color filter which cuts off only the light of the aforementioned 1st color and,
The 2nd coded opening pattern which has the color filter which cuts off only the light of the aforementioned 2nd color and,
Is included,
The claim 10 which features thing or in claim 11 3 dimensional measurement system of statement.
[claim13]
13. With the aforementioned image pickup expedient by doing picture matching which uses aforementioned matching window with the graphics data of each color which is obtained from the graphics data of aforementioned measurement object ones which image pickup depth of aforementioned measurement object ones which designate the image formation position of 2 dimensional pattern as standard are done and the aforementioned reference graphics data group of the same color, is sought, depth of aforementioned measurement object ones is presumed on the basis of the depth which was required with each color,
From the claim 10 which features thing either of claim 12 in one section 3 dimensional measurement system of statement.
[claim14]
14. In order to slip in arrangement direction of the pattern which forms the aforementioned 2 dimensional pattern, the optical axis of optical system of the aforementioned image pickup expedient, is set to the optical axis of the aforementioned projection light and the non same axis,
From the claim 1 which features thing either of claim 13 in one section 3 dimensional measurement system of statement.
[claim15]
15. As for the aforementioned 2 dimensional pattern,
The 1st projection expedient which from 1st direction projects the aforementioned 2 dimensional pattern to aforementioned measurement object ones and,
It is projected the 2nd projection expedient which from 2nd direction projects the aforementioned 2 dimensional pattern to aforementioned measurement object ones and, by,
The claim 13 which features thing or in claim 14 3 dimensional measurement system of statement.
[claim16]
16. Direction of the gap in the optical axis of the aforementioned 1st projection expedient and the aforementioned image pickup expedient crosses, direction of the gap in the optical axis of the aforementioned 2nd projection expedient and the aforementioned image pickup expedient,
In the claim 15 which features thing 3 dimensional measurement system of statement.
[claim17]
17. In order to agree with for the optical axis of the aforementioned image pickup expedient and the optical axis of the aforementioned projection light, it is set,
From the claim 1 which features thing either of claim 13 in one section 3 dimensional measurement system of statement.
[claim18]
18. Through projection optical system, with projection light with image pickup expedient, image pickup doing measurement object ones where 2 dimensional pattern is projected, being 3 dimensional measurement method of presuming the depth of aforementioned measurement object ones by comparing with the graphics data which can and the reference graphics data group which the corresponding attaching and others [re] te beforehand is acquired, in depth of aforementioned measurement object ones,
As for the aforementioned 2 dimensional pattern through the coded opening pattern which is provided in the aforementioned projection optical system as it is projected to aforementioned measurement object ones,
As for depth of aforementioned measurement object ones, 3 dimensional measurement method of featuring that it is presumed by the image processing which applies both parties of the DfD method which is based on the stereo law and the becoming dim of optical axis direction does picture matching which is based on the aforementioned projection optical system and the parallax for aforementioned measurement object ones of the aforementioned image pickup expedient of the aforementioned coded opening pattern which in the graphics data of aforementioned measurement object ones.
[claim19]
19. Through the projection optical system where it can provide coded opening pattern with projection light with image pickup expedient, image pickup doing measurement object ones where 2 dimensional pattern is projected, the computer which presumes the depth of aforementioned measurement object ones by comparing with the graphics data which can and the reference graphics data group which the corresponding attaching and others [re] te beforehand is acquired, in depth of aforementioned measurement object ones,
Depth of aforementioned measurement object ones, as the presumption section which is presumed with the image processing which applies both parties of the DfD method which is based on the stereo law and the becoming dim of optical axis direction does picture matching which is based on the aforementioned projection optical system and the parallax for aforementioned measurement object ones of the aforementioned image pickup expedient of the aforementioned coded opening pattern which in the graphics data of aforementioned measurement object ones functioning 3 dimensional measurement program which features that it can point.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • KAGOSHIMA UNIVERSITY
  • HIROSHIMA CITY UNIVERSITY
  • 発明者(英語)
  • KAWASAKI HIROSHI
  • HORITA YUUKI
  • ONO SATOSHI
  • HIURA SHINSAKU
  • FURUKAWA RYO
国際特許分類(IPC)
指定国 (WO2016186211)
National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KN KP KR KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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