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IMAGING APPARATUS AND IMAGING METHOD NEW_EN

Foreign code F170009245
File No. IP02P003
Posted date Oct 4, 2017
Country WIPO
International application number 2017JP010785
International publication number WO 2017159821
Date of international filing Mar 16, 2017
Date of international publication Sep 21, 2017
Priority data
  • P2016-053549 (Mar 17, 2016) JP
Title IMAGING APPARATUS AND IMAGING METHOD NEW_EN
Abstract Provided are an imaging apparatus and an imaging method that are capable of acquiring higher quality images. According to the present invention, a beam generation unit (11) generates first and second probe beams from laser light. Each of the first and second probe beams comprises a plurality of interference beams different in beat frequency. A beam emitting unit (12) emits the first and second probe beams separately in a sub-scanning direction. Sub-scanning is carried out while positions on a sample (G) irradiated with the first and second probe beams are shifted from each other by moving the sample (G) within a micro flow path (55). An observation image is generated by stacking the images of the sample (G) acquired by the irradiation with the first and second probe beams.
Scope of claims [claim1]
1. The beam formation department which forms the plural probe beams which arrange the plural frequency components spatially and,
The plural aforementioned probe beams concerning respectively, as the aforementioned frequency component is arranged into line condition according to horizontal scanning direction, contiguity or separating the plural aforementioned probe beams in the secondary scan direction which differs from horizontal scanning direction mutually, the beam lighting section which it irradiates to the sample and,
Lighting position and the aforementioned sample of the plural aforementioned probe beams the secondary scan section which is moved to secondary scan direction relatively and,
Detecting the strength of the signal light which it occurs by the fact that the aforementioned probe beam is irradiated to the aforementioned sample the optical sensing station which outputs the detection signal and,
The signal processing unit which forms the observation picture of the aforementioned sample from the signal component every of aforementioned frequency component of the aforementioned detection signal
The imaging device which features that it has.
[claim2]
2. As for the aforementioned beam formation department, in the claim 1 which features that the plural aforementioned probe beams which consist of the plural irregularity lights where strength modulation frequency differs mutually as the aforementioned frequency component are formed the imaging device of statement.
[claim3]
3. As for the aforementioned signal processing unit, in the claim 1 which features that the aforementioned observation picture is formed by dekonboriyushiyon doing the acquisition picture which is obtained from the aforementioned detection signal making use of the information of lighting position of the plural aforementioned probe beams, or 2 the imaging device of statement.
[claim4]
4. As for the plural aforementioned probe beams, phase of beat of irregularity light in the claim 3 which features that the aforementioned probe beam which half period slips vis-a-vis the irregularity light of the other aforementioned probe beam is included the imaging device of statement.
[claim5]
5. The aforementioned secondary scan section moves the plural aforementioned samples to secondary scan direction relatively vis-a-vis the lighting position of the plural aforementioned probe beams,
As for the aforementioned beam lighting section, in the claim 1 which features that it enlarges the interval in the secondary scan direction of the aforementioned probe beam which it adjoins than size of secondary scan direction of the aforementioned sample, at the same time making the interval of the aforementioned probe beam of the both ends of secondary scan direction smaller than minimum of interval of secondary scan direction of the aforementioned sample, it irradiates the plural aforementioned probe beams or 2 the imaging device of statement.
[claim6]
6. As for the aforementioned beam lighting section, as lighting spot of each irregularity light of the plural aforementioned probe beams is arranged with specified arrangement pitch, in order the other each aforementioned probe beam for 1 lighting spots to be allotted respectively between respective lighting spots of one aforementioned probe beam concerning horizontal scanning direction, shifting the plural aforementioned probe beams mutually in horizontal scanning direction, in the claim 2 which features that it irradiates the imaging device of statement.
[claim7]
7. In the claim 2 which features that the aforementioned probe beam to which the aforementioned beam lighting section makes the aforementioned probe beam the plural small territories correspond which divide the lighting range of horizontal scanning direction respectively, corresponds every aforementioned small territory is irradiated the imaging device of statement.
[claim8]
8. As for the aforementioned beam formation department, in the claim 1 which features that the plural aforementioned probe beams which arrange the plural optical frequency components spatially are formed the imaging device of statement.
[claim9]
9. As for the aforementioned secondary scan section, the aforementioned sample with the fluid is the passage device which possesses the passage which flows according to secondary scan direction,
The aforementioned beam lighting section irradiates the plural aforementioned probe beams inside the aforementioned passage
The claim either 1 which features thing or 8 in 1 sections the imaging device of statement.
[claim10]
10. As for aforementioned signal processing unit, in the claim 9 which features that the aforementioned observation picture is revised on the basis of the aforementioned drift speed which from the gap of lighting timing of the aforementioned probe beam for the aforementioned sample which can on the basis of aforementioned detection signal, possesses the speed detector which detects the drift speed of the aforementioned sample, is detected with the aforementioned speed detector concerning secondary scan direction the imaging device of statement.
[claim11]
11. As for the aforementioned secondary scan section, the claim either 1 which features that it is the optical deflector which makes lighting position of the plural aforementioned probe beams secondary scan direction move or 8 in 1 sections the imaging device of statement.
[claim12]
12. In the claim 11 which features that it has the mask board which restricts the range of the secondary scan direction where the plural aforementioned probe beams are irradiated the imaging device of statement.
[claim13]
13. The beam formation step which forms the plural probe beams which arrange the plural frequency components spatially and,
The plural aforementioned probe beams concerning respectively, as the aforementioned frequency component is arranged into line condition according to horizontal scanning direction, contiguity or separating the plural aforementioned probe beams in the secondary scan direction which differs from horizontal scanning direction mutually, the beam lighting step which it irradiates to the sample and,
Lighting position and the aforementioned sample of the plural aforementioned probe beams the secondary scan step which is moved to secondary scan direction relatively and,
Detecting the strength of the signal light which it occurs by the fact that the aforementioned probe beam is irradiated to the aforementioned sample the optical detection step which outputs the detection signal and,
The signal processing step which forms the observation picture of the aforementioned sample from the signal component every of aforementioned frequency component of the aforementioned detection signal
The imaging method of featuring that it possesses.
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
  • Inventor
  • MIKAMI HIDEHARU
  • GODA KEISUKE
IPC(International Patent Classification)
Specified countries (WO2017159821)
National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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