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IMAGE COMPLETION SYSTEM FOR IN-IMAGE CUTOFF REGION, IMAGE PROCESSING DEVICE, AND PROGRAM THEREFOR

Foreign code F130007757
Posted date 2013年12月6日
Country 世界知的所有権機関(WIPO)
International application number 2013JP057392
International publication number WO 2013/141155
Date of international filing 平成25年3月15日(2013.3.15)
Date of international publication 平成25年9月26日(2013.9.26)
Priority data
  • 特願2012-061285 (2012.3.17) JP
Title IMAGE COMPLETION SYSTEM FOR IN-IMAGE CUTOFF REGION, IMAGE PROCESSING DEVICE, AND PROGRAM THEREFOR
Abstract

An image completion system (10) provided with: an operative field endoscope (16) for acquiring an operative field image (V1) in which a subject space is imaged

a completing endoscope (17) for imaging the subject space from a different line of sight than that of the operative field endoscope (16) and acquiring a completing image (V2) for completing the operative field image (V1)

a ranging device (12) for measuring the distance of separation between a reference point and each of a plurality of set points set within the subject space

a three-dimensional position measurement device (13) for measuring the three-dimensional positions of each of the endoscopes (16, 17)

and an image processing device (14) for acquiring, from the completing image (V2), image information about a cut-off region of the subject space hidden behind a surgical instrument (S), by the surgical instrument (S) being imaged in the operative field image (V1) together with the subject space, on the basis of the measurement result, the acquired image information being substituted for or superposed on image information about the surgical instrument (S) in the operative field image (V1).

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • WASEDA UNIVERSITY,
  • KYUSHU UNIVERSITY, NATIONAL UNIVERSITY CORPORATION
  • Inventor
  • FUJIE, MASAKATSU,
  • KOBAYASHI, YO,
  • KAWAMURA, KAZUYA,
  • SENO, HIROTO,
  • NISHIO, YUYA,
  • HASHIZUME, MAKOTO,
  • IEIRI, SATOSHI,
  • TOYODA, KAZUTAKA
IPC(International Patent Classification)
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