TOP > 外国特許検索 > INSPECTION METHOD

INSPECTION METHOD NEW コモンズ

外国特許コード F200010001
整理番号 (N17094)
掲載日 2020年1月29日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2019JP011995
国際公開番号 WO 2019188750
国際出願日 平成31年3月22日(2019.3.22)
国際公開日 令和元年10月3日(2019.10.3)
優先権データ
  • 特願2018-066495 (2018.3.30) JP
発明の名称 (英語) INSPECTION METHOD NEW コモンズ
発明の概要(英語) This inspection method is for inspecting, under atmospheric pressure, the condition of surface electrons of electrode materials or solid-state electrolyte materials for lithium secondary batteries. In this inspection method, the condition of surface electrons of an electrode material for lithium secondary batteries is inspected from the ionization potential specific to the electrode material for lithium secondary batteries or the solid-state electrolyte material.
従来技術、競合技術の概要(英語) BACKGROUND ART
The lithium secondary battery, such as a portable telephone or notebook personal computer has been the application has been put into practical use as a small power source. And power storage applications such as automotive applications further medium, or large applied in a power source has been attempted. And a lithium secondary battery for maintaining the performance of, the lithium secondary battery itself or its performance of the material of the method for testing, various studies have been made. Patent Document 1 is for example, an internal short circuit of the secondary battery to check the inspection method of the secondary battery has been described.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • SHINSHU UNIVERSITY
  • 発明者(英語)
  • TESHIMA Katsuya
  • ZETTSU Nobuyuki
  • YAMADA Tetsuya
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
ライセンスをご希望の方、特許の内容に興味を持たれた方は、下記「問合せ先」まで直接お問い合わせください。

PAGE TOP

close
close
close
close
close
close