TOP > 外国特許検索 > ION CONCENTRATION MEASURING DEVICE

ION CONCENTRATION MEASURING DEVICE NEW

外国特許コード F200010024
整理番号 (S2018-0687-N0)
掲載日 2020年1月30日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2019JP021623
国際公開番号 WO 2019230917
国際出願日 令和元年5月30日(2019.5.30)
国際公開日 令和元年12月5日(2019.12.5)
優先権データ
  • 特願2018-104495 (2018.5.31) JP
発明の名称 (英語) ION CONCENTRATION MEASURING DEVICE NEW
発明の概要(英語) A pH sensor 1 is installed to a measurement object 101 that contains measurement ions 102 and non-measurement ions 103, and measures the concentration of the measurement ions 102. The pH sensor 1 is provided with: a measurement object power supply 16 which controls measurement object voltage (VT) of the measurement object 101; a measurement ISFET 2 including a measurement ion-sensitive membrane 7 that selectively traps the measurement ions 102 and generates a pH-dependent voltage (VPH) in accordance with the number of trapped measurement ions 102; a measurement membrane power supply 18 which controls membrane control voltage (VC) of the measurement ion-sensitive membrane 7; and a power supply control unit 19 which controls the magnitude of voltages outputted respectively from the measurement object power supply 16 and the measurement membrane power supply 18.
従来技術、競合技術の概要(英語) BACKGROUND ART
(Hereinafter referred to as' pH ') is the hydrogen-ion exponent, agriculture and water testing is an important in the art. As means for measuring the pH, using litmus paper means, means using a glass electrode and an ion-selective field-effect transistor (Ion Sensitive Field Effect Transistor: ISFET) using known means. For example, Non-Patent Document 1 is, a technique related to the ISFET.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • SHIZUOKA UNIVERSITY
  • 発明者(英語)
  • FUTAGAWA Masato
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
ライセンスをご希望の方、特許の内容に興味を持たれた方は、下記までご連絡ください。

PAGE TOP

close
close
close
close
close
close