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PARTICLE GROUP MEASUREMENT DEVICE NEW 新技術説明会

外国特許コード F200010207
整理番号 (S2019-0070-N0)
掲載日 2020年7月31日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2019JP043850
国際公開番号 WO 2020096038
国際出願日 令和元年11月8日(2019.11.8)
国際公開日 令和2年5月14日(2020.5.14)
優先権データ
  • 特願2018-210238 (2018.11.8) JP
発明の名称 (英語) PARTICLE GROUP MEASUREMENT DEVICE NEW 新技術説明会
発明の概要(英語) Provided is a particle group measurement device that can estimate particle diameters of particles to be measured, an average value of the particle diameters, particle diameter variance, the number of the particles, and a refractive index in a non-contact manner within an extremely short time. This particle group measurement device prepares, in advance, a scattered light intensity theoretical value table through a preliminary calculation process. First and second polarization cameras are installed at positions of scattering angles ±θ defined during the preliminary calculation process. A distance local minimum value calculation unit identifies records, in the scattered light intensity theoretical value table, that are most similar to a measured first wavelength first scattered light intensity (I1λ1) and a measured first wavelength second scattered light intensity (I2λ1) outputted from the first polarization camera, and a measured second wavelength first scattered light intensity (I1λ2) and a measured second wavelength second scattered light intensity (I2) outputted from the second polarization camera, and outputs the refractive index m, the standard deviation σg, the average article diameter Dg, and the number n of particles.
従来技術、競合技術の概要(英語) BACKGROUND ART
And the fine particles contained in the exhaust gas of the automobile, such as continental aerosol is flying from the yellow sand, 1μm particle diameter is less than the submicron particles are known to contain a large amount. In addition, in recent years with the development of liquid atomization technique, the arithmetic average particle size of the order of a few µm it becomes possible to generate a fine spray and have, the lower limit of the particle size distribution, 1μm or less is no longer estimated region. Such sub-micron particles in order to understand the behavior, the particle size measuring method is the establishment of an essential problem.
Close to the art of the present invention documents the prior art shown in Patent Document 1 and Non-Patent Document 1. Patent Document 1 is, on the basis of the present invention by the inventors of the present technique, the grain size measuring apparatus and the grain size measuring method is disclosed. Is the non-patent document 1, the order of sub-micron region 1nm-10μm target particle size range for the grain size measuring method has been described, in accordance with the respective particle size range for the characteristics of the measuring method are described. In addition, the grain size measuring method, mainly classified into a non-contact type and the collection type.
A non-contact type and the grain size measuring method, and laser light is used for the main, using a laser diffraction light scattering pattern, the light scattering method using scattered light intensity, the frequency variation of the light scattered by particle motion using known dynamic light scattering method or the like. These are, for the probe by using a laser beam, and the non-contact measurement, three-dimensional measurement is possible by the method 2 has a great advantage.
Is a light scattering method and a laser diffraction method, the order of the grain size measuring range 100nm-100μm has, the fuel spray, the particle size of the powder are widely used for the measurement. However at present, the average particle diameter is equal to or less than 1μm are applied directly to a number of difficulties.
Is a dynamic light scattering method, an extremely small particle size on the order 1nm-1μm and measurement, particle generation in the flame applied to the observation of the great achievements during exemplified. However, a strong laser light source because of the need for complex signal processing, the measurement point 2 is three-dimensional data acquisition for the base, the need for many experiments, to come to practical use, has many difficulties.
Particles were taken as the sampling analysis type particle size measuring method, optical, the measurement method using an electron microscope, inertial impaction method, gravity sedimentation, a centrifugal sedimentation method, electric detection zone method, electrostatic classification method or the like has been known a number of ways. Such collection-type particle size measuring method, the order of 1nm in some approaches are available to measure the extremely small particle size. However, it is necessary to analyze the collected particles and therefore, particle size and spatial distribution of the lost valuable information such as changes in time there is a problem.
On the other hand, laser light was used as the sub-micron-size measuring method, the polarization ratio method has been known. Polarization ratio method, the aerosol particle size measuring method has been developed as a technique, the fine particles in the flame applied to the observation of the course of generating the, and the great achievements. Polarization ratio method, the scattered light from particles 2 included in the intensity ratio of one polarization component that is dependent on particle size and nature of the present invention.
Using polarization ratio can be measured in the particle size, particles smaller than the wavelength of the laser can be measured and also, the non-contact manner are available to measure the particle size has a great advantage. However, a narrow particle size range can be measured, in the present invention is not limited to 1nm-100nm.
Therefore, the polarization ratio of light scattering or laser diffraction method of the above-described method and the grain diameter such as the measurement range is not duplicated, and the grain size measuring method of filling the space between the two development is demanded.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • GUNMA UNIVERSITY
  • 発明者(英語)
  • ARAKI Mikiya
  • KOIZUMI Yuichi
  • KIRIBAYASHI Seibu
  • ODA Shotaro
  • Long Cheng
  • IKEDA Kazuki
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DJ DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JO JP KE KG KH KN KP KR KW KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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