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DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM achieved

Foreign code F080001985
File No. F080001985
Posted date Dec 5, 2008
Country WIPO
International application number 2007JP070738
International publication number WO 2008/056541
Date of international filing Oct 24, 2007
Date of international publication May 15, 2008
Priority data
  • P2006-301012 (Nov 6, 2006) JP
Title DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, PROGRAM, AND RECORDING MEDIUM achieved
Abstract A diagnostic device providing a favorable diagnosis result by further improving the diagnosis resolution. A diagnostic device (1) has a symbol inserting section (3) which is composed of an active element symbol inserting sub-section (5) and a passive element symbol inserting sub-section (7), an occurrence probability imparting section (9), and equivalent occurrence probability imparting section (11), and a switching section (13). A per-test X failure diagnosis flow by the diagnostic device (1) is structured by a failure information collection stage and a diagnosis conclusion stage. The layout of a deep submicron LSI circuit frequently needs multilayer interconnection and information on vias to be widely used is used. Therefore, the passive element symbol inserting sub-section (7) can indicate defective portions at the via level, and the diagnosis resolution is significantly improved. The occurrence probability imparting section (9) uses a new diagnosis value and takes the occurrence probability of a logical combination of possible failures which may occur into consideration. As a result, the actual operation of a deep submicron LSI circuit is well reflected, and is useful for improvement of the diagnosis resolution.
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • Japan Science and Technology Agency
  • Kyushu Institute of Technology
  • System JD Co., Ltd.
  • Inventor
  • WEN, Xiaoqing
  • KAJIHARA, Seiji
  • MIYASE, Kohei
  • MINAMOTO, Yoshihiro
  • DATE, Hiroshi
IPC(International Patent Classification)
Specified countries AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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