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GENERATION DEVICE, GENERATION METHOD, PROGRAM AND RECORDING MEDIUM achieved

Foreign code F080001986
File No. F080001986
Posted date Dec 5, 2008
Country WIPO
International application number 2007JP068505
International publication number WO 2008/041537
Date of international filing Sep 25, 2007
Date of international publication Apr 10, 2008
Priority data
  • P2006-262764 (Sep 27, 2006) JP
Title GENERATION DEVICE, GENERATION METHOD, PROGRAM AND RECORDING MEDIUM achieved
Abstract A generation device and the like are provided for generating a test vector which can efficiently reduce power consumption at the time of capture. A generation device (100) is comprised of a selection unit (101) which allocates logic values to a plurality of unfixed value bits included in a test cube for a logic circuit to generate a test vector and selects an allocation subject unfixed value bit from a plurality of the unfixed value bits, a capture transition digitizing unit (103) for calculating the number of capture transitions by the test cube including the unfixed value bits, and a logic value allocation unit (105) which applying a first test cube allocating a logic 0 to the selected allocation subject unfixed value bits and a second test cube allocating a logic 1 to the capture transition digitizing unit (103), compares the number of capture transitions in accordance with the first test cube and that in accordance with the second test cube, and allocates a logic value corresponding to the less number of the capture transitions of either the first or second test cube to the selected allocation subject unfixed value bits.
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • Japan Science and Technology Agency
  • Kyushu Institute of Technology
  • System JD Co., Ltd.
  • Inventor
  • WEN, Xiaoqing
  • KAJIHARA, Seiji
  • MIYASE, Kohei
  • MINAMOTO, Yoshihiro
  • DATE, Hiroshi
IPC(International Patent Classification)
Specified countries AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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