Top > Search of International Patents > METHOD FOR CONTROLLING INTER-COMPONENT PHASE DIFFERENCE SOLITON AND INTER-COMPONENT PHASE DIFFERENCE SOLITON CIRCUIT DEVICE

METHOD FOR CONTROLLING INTER-COMPONENT PHASE DIFFERENCE SOLITON AND INTER-COMPONENT PHASE DIFFERENCE SOLITON CIRCUIT DEVICE

Foreign code F110002708
File No. S2008-0332-C0
Posted date Apr 8, 2011
Country WIPO
International application number 2009JP053617
International publication number WO 2009/107756
Date of international filing Feb 20, 2009
Date of international publication Sep 3, 2009
Priority data
  • P2008-049605 (Feb 29, 2008) JP
Title METHOD FOR CONTROLLING INTER-COMPONENT PHASE DIFFERENCE SOLITON AND INTER-COMPONENT PHASE DIFFERENCE SOLITON CIRCUIT DEVICE
Abstract A method for controlling an inter-component phase difference soliton by using division or fusion caused by the interaction of an inter-component phase difference soliton without applying external energy. The method uses a line structure (10) where an inter-component phase difference soliton propagation line through which an inter-component phase difference soliton (So) capable of existing in a superconducting environment can travel is divided into branch lines (10-1, 10-2) at least at a branch end (Po) provided in the line. The inter-component phase difference soliton (So) in the main line (10M) which is the undivided line part is divided and made to enter the branch lines (10-1, 10-2) without supplying external energy. Alternatively, inter-component phase difference solitons (So1, So2) existing in the branch lines (10-1, 10-2) are fused without supplying external energy. Thus the inter-component phase difference soliton (So) is propagated through the main line (10M).
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
  • Tokyo University of Science Educational Foundation Administrative Organization
  • KAGOSHIMA UNIVERSITY
  • Inventor
  • TANAKA, Yasumoto
  • IYO, Akira
  • SHIVAGAN, Dilip
  • SHIRAGE, Parasharam
  • TOKIWA, Kazuyasu
  • WATANABE, Tsuneo
  • TERADA, Norio
IPC(International Patent Classification)
Specified countries AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM(UTILITY MODEL),DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
Please contact us by E-mail if you have any interests on this patent.

PAGE TOP

close
close
close
close
close
close