Top > Search of International Patents > OPTICAL MICROSCOPE

OPTICAL MICROSCOPE meetings

Foreign code F110002920
File No. S2008-0660-C0
Posted date May 9, 2011
Country WIPO
International application number 2009JP060190
International publication number WO 2009/148094
Date of international filing Jun 3, 2009
Date of international publication Dec 10, 2009
Priority data
  • P2008-146335 (Jun 3, 2008) JP
Title OPTICAL MICROSCOPE meetings
Abstract Provided is an optical microscope for optically measuring a sample (30). The optical microscope is provided with a fluorescent thin film (13), which partially contains a fluorescent material and permits the sample (30) to be placed thereon; an electron source (11) which generates an electron beam; an electron lens (12), which focuses the electron beam generated by the electron source (11) and irradiates the fluorescent member with the electron beam so that a micro-light source having a wavelength of less than a visible light wavelength is excited from the fluorescent thin film (13) and makes the focused electron beam perform scanning; and a photodetector (22) which detects measuring light which has been generated by the micro-light source and operated to the sample (30).
Scope of claims (In Japanese)
【請求項1】 測定対象物を光学的に測定する光学顕微鏡であって、
 少なくとも一部に蛍光物質を含み、前記測定対象物が載置される蛍光部材と、
 電子ビームを発生する電子ビーム発生手段と、
 前記蛍光部材から可視光波長未満の波長の微小光源が励起されるように前記電子ビーム発生手段で発生された電子ビームを絞って前記蛍光部材に照射すると共に、前記絞られた電子ビームを走査する電子ビーム制御手段と、
 前記微小光源で発生され前記測定対象物に作用した測定光を検出する光検出手段と、
を備えた光学顕微鏡。

【請求項2】 前記電子ビーム発生手段と前記電子ビーム制御手段とが真空部に配置された真空容器を更に備え、
 前記蛍光部材は、前記真空容器の隔壁に形成された貫通孔の部分に配置されて、前記隔壁の一部となり、
 前記微小光源は、前記貫通孔を通過する前記電子ビームにより励起される
請求項1記載の光学顕微鏡。

【請求項3】 前記貫通孔は複数個である
請求項1記載の光学顕微鏡。

【請求項4】 測定対象物を光学的に測定する光学顕微鏡であって、
 少なくとも一部に蛍光物質を含み、前記測定対象物が載置される蛍光部材と、
 電子ビームを発生する電子ビーム発生手段と、
 前記電子ビーム発生手段で発生した電子ビームを制御して前記蛍光部材内に照射し、前記蛍光部材内に可視光波長未満の大きさの微小光源を励起させる電子ビーム制御手段と、
 前記微小光源で発生され前記測定対象物に作用した測定光を検出する光検出手段と、
を備えた光学顕微鏡。
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • NATIONAL UNIVERSITY CORPORATION SHIZUOKA UNIVERSITY
  • Inventor
  • KAWATA, Yoshimasa
  • MIYAKAWA, Atsuo
IPC(International Patent Classification)
Specified countries AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
Please contact us by E-mail or facsimile if you have any interests on this patent.

PAGE TOP

close
close
close
close
close
close