Cantilever for Scanning Probe Microscope and Scanning Probe Microscope Equipped With It
A microscope including both an atomic force microscope and a near-field optical microscope and capable of performing electrochemical measurements and a cantilever for the microscope are disclosed. A pointed light transmitting material employed as the probe of an atomic force microscope is coated with a metal layer
the metal layer is further coated with an insulating layer
the insulating layer is removed only at the distal end to expose the metal layer
the slightly exposed metal layer is employed as a working electrode
and the probe can be employed not only as the probe of the atomic force microscope and the near-field optical microscope but also as the electrode of an electrochemical microscope. Consequently, the microscope can have the functions of an atomic force microscope, a near-field optical microscope and an electrochemical microscope.