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Electronic device using quantum dot

外国特許コード F110003835
整理番号 I024P002WO
掲載日 2011年7月6日
出願国 アメリカ合衆国
出願番号 74659908
公報番号 20100270534
公報番号 8222629
出願日 平成20年12月4日(2008.12.4)
公報発行日 平成22年10月28日(2010.10.28)
公報発行日 平成24年7月17日(2012.7.17)
国際出願番号 JP2008072035
国際公開番号 WO2009072550
国際出願日 平成20年12月4日(2008.12.4)
国際公開日 平成21年6月11日(2009.6.11)
優先権データ
  • 特願2007-316648 (2007.12.7) JP
  • 2008WO-JP72035 (2008.12.4) WO
発明の名称 (英語) Electronic device using quantum dot
発明の概要(英語) (US8222629)
An electronic device using quantum dots, which comprises a ferromagnetic micro magnet and performs individual ESR control on each multi-quantum bit in a power saving way.
The electronic device comprising the ferromagnetic micro magnet (10) disposed in the vicinity of the quantum dots (8, 9) of a plurality of aligned semiconductor quantum dots, wherein a strong magnetic field is applied so as to induce electron spin resonance (ESR), and the layout of the ferromagnetic micro magnet (10) is changed, thereby controlling the resonance frequency of the quantum dots (8, 9).
Under the condition where the resonance frequency of each quantum dot (8, 9) is controlled, swapping of the electron spins in the quantum dots (8, 9) is performed, thereby creating a quantum bit (QUBIT) required for quantum calculation.
特許請求の範囲(英語) [claim1]
1. An electronic device using quantum dots, comprising: a plurality of aligned semiconductor quantum dots formed in a semiconductor crystal substrate;
a plurality of gate electrodes formed on a surface of the semiconductor substrate;
an electrode for applying an ESR signal;
a dielectric film formed on the semiconductor crystal substrate;
a single ferromagnetic micro magnet formed on a surface of the dielectric film and above the semiconductor quantum dots, the magnet being a ferro magnetic thin film and transforming a high frequency electric field to a high frequency magnetic field; and
a control electrode disposed halfway between the quantum dots, wherein a coupling state of electrons is controlled by applying a voltage to the control electrode to extend or contract a depletion layer under the control electrode.
[claim2]
2. The electronic device of claim 1, wherein a frequency of the high frequency electric field is 1.6 GHz and more and 300 GHz or less.
[claim3]
3. The electronic device of claim 2, wherein a frequency of the high frequency electric field is 1.6 GHz and more and 3 GHz or less.
[claim4]
4. The electronic device of claim 2, wherein a frequency of the high frequency electric field is 3 GHz and more and 30 GHz or less.
[claim5]
5. The electronic device of claim 2, wherein a frequency of the high frequency electric field is 30 GHz and more and 300 GHz or less.
[claim6]
6. The electronic device of claim 1, wherein the ferromagnetic thin film is made from cobalt or cobalt alloy containing 50% and more of cobalt.
[claim7]
7. The electronic device of claim 6, wherein a thickness of the ferromagnetic thin film is from 0.05 mu m to 1 mu m, a width of the ferromagnetic thin film is from 0.3 mu m to 0.4 mu m, and a length of the ferromagnetic thin film is 1 mu m.
[claim8]
8. The electronic device of claim 1, wherein the ferromagnetic thin film is made from nickel or nickel alloy containing 50% and more of nickel.
[claim9]
9. The electronic device of claim 8, wherein a thickness of the ferromagnetic thin film is from 0.15 mu m to 3 mu m, a width of the ferromagnetic thin film is from 0.3 mu m to 0.4 mu m, and a length of the ferromagnetic thin film is 1 mu m.
[claim10]
10. The electronic device of claim 1, wherein the ferromagnetic thin film is made from dysprosium or dysprosium alloy containing 50% and more of dysprosium.
[claim11]
11. The electronic device of claim 10, wherein a thickness of the ferromagnetic thin film is from 0.025 mu m to 1 mu m, a width of the ferromagnetic thin film is from 0.3 mu m to 0.4 mu m, and a length of the ferromagnetic thin film is 1 mu m.
[claim12]
12. The electronic device of claim 1, wherein the ferromagnetic thin film is made from iron or iron alloy containing 50% and more of iron.
[claim13]
13. The electronic device of claim 12, wherein a thickness of the ferromagnetic thin film is from 0.025 mu m to 1 mu m, a width of the ferromagnetic thin film is from 0.3 mu m to 0.4 mu m, and a length of the ferromagnetic thin film is 1 mu m.
[claim14]
14. The electronic device of claim 1, wherein the ferromagnetic thin film is made from chromium or chromium alloy containing 50% and more of chromium.
[claim15]
15. The electronic device of claim 14, wherein a thickness of the ferromagnetic thin film is from 0.025 mu m to 1 mu m, a width of the ferromagnetic thin film is from 0.3 mu m to 0.4 mu m, and a length of the ferromagnetic thin film is 1 mu m.
[claim16]
16. The electronic device of claim 1, wherein a gradient magnetic field and a parallel magnetic field with respect to the surface of the quantum dots are generated due to a magnetic field generated by the ferromagnetic thin film.
[claim17]
17. The electronic device of claim 16, wherein an energy state of electron spin in each quantum dot is changed by applying a strong external magnetic field under an ultra-low temperature, and each quantum dot has an individual energy state by the action of the parallel magnetic field.
[claim18]
18. The electronic device of claim 16, wherein an electron disposed in the vicinity of the quantum dots are electrically driven under the influence of the gradient magnetic field, and electron spin resonance is realized.
[claim19]
19. The electronic device of claim 18, wherein an electron spin state can be manipulated to be a spin-up state and a spin-down state by the electron spin resonance, and the electron spin state is related to a bit, thereby setting a quantum bit.
[claim20]
20. The electronic device of claim 1, wherein each quantum dot has a different energy state by the action of the ferromagnetic magnet.
[claim21]
21. The electronic device of claim 1, wherein electron spin can be manipulated independently by applying a high frequency electric field with different frequency to each quantum dot, according to the electron spin resonance principle.
[claim22]
22. The electronic device of claim 1, wherein electrons present in the quantum dots mutually form an electronic coupling state.
[claim23]
23. The electronic device of claim 1, wherein quantum calculation is performed by manipulating the coupling state of electrons.
[claim24]
24. The electronic device of claim 1, wherein each quantum dot has a horizontal quantum dot structure with a gate electrode for forming a quantum dot, the gate electrode being disposed on a surface of a semiconductor crystal substrate, the substrate having a two-dimensional electron gas layer at a heterojunction interface between a gallium arsenide and an aluminum gallium arsenide.
[claim25]
25. The electronic device of claim 1, wherein each quantum dot has a horizontal quantum dot structure with a gate electrode for forming a quantum dot, the gate electrode being disposed on a surface of a semiconductor crystal substrate, the substrate having a two-dimensional electron gas layer at a heterojunction interface between a silicon and a silicon germanium.
[claim26]
26. The electronic device of claim 24, wherein each quantum dot has a vertical quantum dot structure in which the two-dimensional electron gas layer is geometrically cut out and a metallic electrode is disposed on the periphery of the cut out layer.
[claim27]
27. The electronic device of claim 1, wherein the ferromagnetic magnet is made from a ferromagnetic metal, an oxide ferromagnetic metal, a superconductive metal, or an oxide superconductive metal.
[claim28]
28. The electronic device of claim 1, wherein a distance from the ferromagnetic magnet to each semiconductor quantum dot is different.
[claim29]
29. The electronic device of claim 28, wherein the distance from the ferromagnetic magnet to each semiconductor quantum dot varies from 0.15 mu m to 0.5 mu m, and a thickness of the ferromagnetic magnet is 0.1 mu m.
[claim30]
30. The electronic device of claim 1, wherein a thickness of the ferromagnetic magnet in the nearest neighborhood of each quantum dots is varied.
[claim31]
31. The electronic device of claim 30, wherein a thickness of the ferromagnetic magnet varies from 0.025 mu m to 1 mu m.
[claim32]
32. The electronic device of claim 1 wherein a dielectric film is disposed between the ferromagnetic magnet and the electrodes or the gate electrodes for forming a quantum dot.
[claim33]
33. The electronic device of claim 32, wherein the dielectric film is an electron beam lithography resist, a photoresist or silicon dioxide, or silicon nitride.
[claim34]
34. The electronic device of claim 1, wherein the dimensions of the ferromagnetic magnet, the control electrode, and the gate electrodes for forming a quantum dot are changed uniformly so as to provide the same function only by changing a magnitude of applied voltage.
[claim35]
35. The electronic device of claim 1, further comprising a control electrode, an electrode for forming a quantum dot, and a readout quantum point contact gate electrode in the vicinity of the semiconductor quantum dots, and further comprising a quantum point contact exhibiting one dimensional quantized electron conduction phenomenon.
[claim36]
36. The electronic device of claim 1, further comprising a quantum point contact which changes its conductivity depending on the number of electric charges in the neighboring quantum dots.
[claim37]
37. The electronic device of claim 1, wherein readout of an electron spin state is performed by means of detection of an electron coupling state between the quantum dots and an electric charge.
[claim38]
38. The electronic device of claim 1, wherein an electron spin polarized current utilizing electron spin alignment due to a leakage magnetic field can be injected in the vicinity of the ferromagnetic thin film.
[claim39]
39. The electronic device of claim 1, wherein a flip-flop operation can be performed by controlling an electron spin state of each quantum dot uniquely.
[claim40]
40. The electronic device of claim 17, wherein quantum calculation can be performed by controlling a coupling state between the electron spins.
  • 発明者/出願人(英語)
  • PIORO-LADRIERE MICHEL
  • OBATA TOSHIAKI
  • SHIN YUN-SOK
  • KUBO TOSHIHIRO
  • TARUCHA SEIGO
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
国際特許分類(IPC)
米国特許分類/主・副
  • B82Y010/00
  • G06N099/00K
  • H01L029/66S
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