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Shear measuring method and its device meetings achieved

Foreign code F110004619
File No. N051-14WO
Posted date Jul 20, 2011
Country China
Application number 200680036158
Gazette No. 101278184
Gazette No. 101278184
Date of filing Sep 27, 2006
Gazette Date Oct 1, 2008
Gazette Date Jul 4, 2012
Priority data
  • P2005-282769 (Sep 28, 2005) JP
  • P2005-282768 (Sep 28, 2005) JP
Title Shear measuring method and its device meetings achieved
Abstract

A resonant shear measuring method for simply measuring a resonant shear in a short time by Fourier-transforming the damping curve of the vibration on one side of a sample during the measurement of the shear response of the sample to obtain the resonant shear curve. An input signal (Uin) is inputted into a horizontal drive section of a resonant shear measurement unit. The vibration of one side of a sample clamped between the solid surfaces of the resonant shear measurement unit is detected as an output signal (Uout) by means of a displacement gauge. The output signal (Uout) along with the input signal (Uin) are inputted into a resonant shear measurement device. The shear response of the sample is measured together with the variation of the film thickness.

The damping curve of the vibration of the one side of the sample is Fourier-transformed by a Fourier transform section (5B) to obtain the resonant shear curve. A twin-path shear stress measurement device for precisely measuring a shear stress by a twin-path method for measuring the distance between opaque substrates.

  • Applicant
  • JAPAN SCIENCE & TECH AGENCY
  • Inventor
  • KURIHARA KAZUE,
  • SAKUMA HIROSHI,
  • MIZUKAMI MASASHI
IPC(International Patent Classification)
Reference ( R and D project ) CREST Creation of Novel Nano-material/System Synthesized by Self-organization for Medical Use AREA
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