Optically reconfigurable gate array write state inspection method, write state inspection device, and optically reconfigurable gate array
There is provided a write state inspection technique not requiring a circuit dedicated to a write state inspection of inside of a logical circuit of the ORGA. An optical signal pattern configures the logical circuit structure in the ORGA as follows: when an optical signal irradiated to the optically reconfigurable bit element to be inspected is switched from ON to OFF, at least one logical level or output impedance is changed. A first and a second optical signal pattern in which an optical signal irradiated to the optically reconfigurable bit element to be inspected is ON or OFF are successively irradiated/inputted to the logical circuit.
Together with this, each of the output states is detected by an output state detection circuit connected to the respective logical output terminals and detecting whether the logical level of the output terminal is at H level, L level, or high impedance. The state detected is compared to the normal output state of the inputted optical signal pattern so as to judge whether the information write state by the optical signal for each optically reconfigurable bit element is successful.