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Method and device for measuring thermoelectric characteristics of combinatorial specimen

外国特許コード F110005087
整理番号 A051-69US
掲載日 2011年8月19日
出願国 アメリカ合衆国
出願番号 45070903
公報番号 20040047398
公報番号 6902317
出願日 平成14年3月14日(2002.3.14)
公報発行日 平成16年3月11日(2004.3.11)
公報発行日 平成17年6月7日(2005.6.7)
国際出願番号 JP2002002415
国際公開番号 WO2002075297
国際出願日 平成14年3月14日(2002.3.14)
国際公開日 平成14年9月26日(2002.9.26)
優先権データ
  • 特願2001-075954 (2001.3.16) JP
  • 2002WO-JP02415 (2002.3.14) WO
発明の名称 (英語) Method and device for measuring thermoelectric characteristics of combinatorial specimen
発明の概要(英語) (US6902317)
A method and device for measuring thermoelectric characteristics of a combinatorial sample.
The method and device are useful for rapid sample evaluation, the investigation of thermoelectric materials, and the carrier control of semiconductors.
The device includes combinatorial samples patterned with a metal mask, a pair of sample holders for applying a small temperature gradient to the sample, a thermocouple for measuring the temperature gradient, and a probe pin array in contact with the sample.
特許請求の範囲(英語) [claim1]
1. A method for measuring thermoelectric characteristics of a combinatorial sample, comprising the steps of: applying a small temperature gradient to a patterned combinatorial sample disposed between two or more hot baths with a temperature difference of 3 deg. C. or less;
measuring the temperature gradient of the combinatorial sample;
obtaining a plurality of electrical signals in the temperature gradient direction from the patterned combinatorial sample;
and determining the thermoelectric characteristics based on the temperature gradient and the plurality of electrical signals.
[claim2]
2. A device for measuring thermoelectric characteristics of a combinatorial sample, comprising: a patterned combinatorial sample;
two or more hot baths with a temperature difference of 3 deg. C. or less for applying a small temperature gradient to the patterned combinatorial sample;
a measuring device measuring the temperature gradient;
and a component for obtaining a plurality of electrical signals in the temperature gradient direction, the component being in contact with or being connected to the patterned combinatorial sample.
  • 発明者/出願人(英語)
  • KOINUMA HIDEOMI
  • KAWAJI HITOSHI
  • ITAKA KENJI
  • MINAMI HIDEKI
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
国際特許分類(IPC)
米国特許分類/主・副
  • G01K007/02
  • H01L035/00
  • S01R031/26
参考情報 (研究プロジェクト等) CREST Single Molecule and Atom Level Reactions AREA
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