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Method and device for measuring thermoelectric characteristics of combinatorial specimen

Foreign code F110005087
File No. A051-69US
Posted date Aug 19, 2011
Country United States of America
Application number 45070903
Gazette No. 20040047398
Gazette No. 6902317
Date of filing Mar 14, 2002
Gazette Date Mar 11, 2004
Gazette Date Jun 7, 2005
International application number JP2002002415
International publication number WO2002075297
Date of international filing Mar 14, 2002
Date of international publication Sep 26, 2002
Priority data
  • P2001-075954 (Mar 16, 2001) JP
  • 2002WO-JP02415 (Mar 14, 2002) WO
Title Method and device for measuring thermoelectric characteristics of combinatorial specimen
Abstract (US6902317)
A method and device for measuring thermoelectric characteristics of a combinatorial sample.
The method and device are useful for rapid sample evaluation, the investigation of thermoelectric materials, and the carrier control of semiconductors.
The device includes combinatorial samples patterned with a metal mask, a pair of sample holders for applying a small temperature gradient to the sample, a thermocouple for measuring the temperature gradient, and a probe pin array in contact with the sample.
Scope of claims [claim1]
1. A method for measuring thermoelectric characteristics of a combinatorial sample, comprising the steps of: applying a small temperature gradient to a patterned combinatorial sample disposed between two or more hot baths with a temperature difference of 3 deg. C. or less;
measuring the temperature gradient of the combinatorial sample;
obtaining a plurality of electrical signals in the temperature gradient direction from the patterned combinatorial sample;
and determining the thermoelectric characteristics based on the temperature gradient and the plurality of electrical signals.
[claim2]
2. A device for measuring thermoelectric characteristics of a combinatorial sample, comprising: a patterned combinatorial sample;
two or more hot baths with a temperature difference of 3 deg. C. or less for applying a small temperature gradient to the patterned combinatorial sample;
a measuring device measuring the temperature gradient;
and a component for obtaining a plurality of electrical signals in the temperature gradient direction, the component being in contact with or being connected to the patterned combinatorial sample.
  • Inventor, and Inventor/Applicant
  • KOINUMA HIDEOMI
  • KAWAJI HITOSHI
  • ITAKA KENJI
  • MINAMI HIDEKI
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
IPC(International Patent Classification)
Reference ( R and D project ) CREST Single Molecule and Atom Level Reactions AREA
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