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Method of growing semiconductor crystal meetings

Foreign code F110005381
File No. K02008US
Posted date Sep 5, 2011
Country United States of America
Application number 54968304
Gazette No. 20060180077
Gazette No. 7625447
Date of filing Mar 18, 2004
Gazette Date Aug 17, 2006
Gazette Date Dec 1, 2009
International application number JP2004003689
International publication number WO2004084283
Date of international filing Mar 18, 2004
Date of international publication Sep 30, 2004
Priority data
  • P2003-076044 (Mar 19, 2003) JP
  • 2004WO-JP03689 (Mar 18, 2004) WO
Title Method of growing semiconductor crystal meetings
Abstract (US7625447)
SiC is a very stable substance, and it is difficult to control the condition of a SiC surface to be suitable for crystal growth in conventional Group III nitride crystal growing apparatuses.
This problem is solved as follows.
The surface of a SiC substrate 1 is rendered into a step-terrace structure by performing a heating process in an atmosphere of HCl gas.
The surface of the SiC substrate 1 is then treated sequentially with aqua regia, hydrochloric acid, and hydrofluoric acid.
A small amount of silicon oxide film formed on the surface of the SiC substrate 1 is etched so as to form a clean SiC surface 3 on the substrate surface.
The SiC substrate 1 is then installed in a high-vacuum apparatus and the pressure inside is maintained at ultrahigh vacuum (such as 10-6 to 10-8 Pa).
In the ultrahigh vacuum state, a process of irradiating the surface with a Ga atomic beam 5 at time t1 at temperature of 800° C. or lower and performing a heating treatment at 800° C. or higher is repeated at least once.
The temperature is then set to the growth temperature of an AlN film, and the SiC substrate surface 3 is initially irradiated with Al atoms 8a in ultrahigh vacuum state, followed by the feeding of N atoms 8b.
Scope of claims [claim1]
1. A crystal growing method, comprising the steps of: forming a step-terrace structure on said SiC surface;
removing an oxide film which is naturally formed on said surface in an atmosphere of reduced oxygen partial pressure and covers the step-terrace structure;
after the removing step, performing at least one cycle of a process including irradiating Si or Ga atomic beam on the surface and then heating the irradiated surface thereby separating said Ga or Si from the irradiated surface and removing oxygen on the surface to provide a flat and clean SiC surface; and
after the performing step, growing a Group-III nitride on the surface without said Ga or Si left in-between while the step-terrace structure is maintained, by adjusting a pre-feeding time of a Group-III element thereby preventing excess aggregation or lack of the Group-III element, feeding the Group III element and feeding nitrogen after the Group III element has been fed.
[claim2]
2. The crystal growing method according to claim 1, wherein said SiC surface has an offset angle of 0-15 deg. with respect to the (0001) Si or (000-1) C plane.
[claim3]
3. A crystal growing method, comprising the steps of: forming a step-terrace structure that is flat at an atomic level on a SiC surface and then removing an oxide film, which is naturally formed thereon and covers the step-terrace structure, from the surface;
after the forming and then removing step, performing at least one cycle of a process including irradiating Si or Ga atomic beam on the surface and then heating the irradiated surface thereby separating said Ga or Si from the irradiated surface and removing oxygen on the surface; and
after the performing step, growing a Group-III nitride on the surface,
wherein the Group-III nitride contains Al, and the step of growing a Group-III nitride is conducted under high vacuum and comprises the steps of:
step-flow-feeding Ga or In as a surface controlling element thereby controlling the mode of crystal growth as layer-by-layer of the Group-III nitride on said SiC surface, and each layer of the Group-III nitride consisting of fused two-dimensional nuclei of the Group-III nitride; and then
feeding a Group III element and nitrogen, followed by the termination of the feeding of said surface controlling element.
[claim4]
4. The crystal growing method according to claim 3, wherein the surface controlling element is either fed in a form of gas or irradiated on the surface in a form of an atomic beam.
[claim5]
5. The crystal growing method according to claim 3, wherein said SiC surface has an offset angle of 0-15 deg. with respect to the (0001) Si or (000-1) C plane.
  • Inventor, and Inventor/Applicant
  • SUDA JUN
  • MATSUNAMI HIROYUKI
  • ONOJIMA NORIO
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
IPC(International Patent Classification)
Reference ( R and D project ) PRESTO Nanostructure and Material Property AREA
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