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Dynamic mode AFM apparatus

Foreign code F110005513
File No. N021-13WO
Posted date Sep 7, 2011
Country United States of America
Application number 99007009
Gazette No. 20110055983
Gazette No. 8151368
Date of filing Apr 8, 2009
Gazette Date Mar 3, 2011
Gazette Date Apr 3, 2012
International application number JP2009057158
International publication number WO2009139238
Date of international filing Apr 8, 2009
Date of international publication Nov 19, 2009
Priority data
  • P2008-124891 (May 12, 2008) JP
  • 2009WO-JP57158 (Apr 8, 2009) WO
Title Dynamic mode AFM apparatus
Abstract (US8151368)
A dynamic mode AFM apparatus for allowing high-speed identification of atoms of a sample surface, which comprises a scanner for performing three-dimensional scanning; an AC signal of a resonance frequency in a mode with flexural vibration of a cantilever; an AC signal of a second frequency which is lower than the frequency of the flexural vibration; a probe-sample distance modulated with the second frequency; a detector for detecting fluctuation of the resonance frequency; a detector for detecting vibration of the cantilever; and a detector for detecting a fluctuation component which is contained in a detected signal by detecting the resonance frequency fluctuation and synchronized with a modulation signal of the probe-sample distance, wherein an inclination of the resonance frequency against the probe-sample distance is obtained from the strength and polarity of the fluctuation component.
Scope of claims [claim1]
1. A dynamic mode AFM apparatus comprising: (a) a scanner for performing three-dimensional relative scanning of a cantilever and a sample;
(b) a means for generating an AC signal of a resonance frequency in a mode with flexural vibration of the cantilever;
(c) a means for exciting the flexural vibration of the cantilever with the resonance frequency;
(d) a means for generating an AC signal of a second frequency which is lower than the frequency of the flexural vibration;
(e) a means for modulating a probe-sample distance of the cantilever with the second frequency;
(f) a means for detecting fluctuation of the resonance frequency;
(g) a means for detecting vibration of the cantilever; and
(h) a means for detecting a fluctuation component which is contained in a detected signal by the means for detecting the resonance frequency fluctuation and synchronized with a modulation signal of the probe-sample distance,
(i) wherein an inclination of the resonance frequency against the probe-sample distance is obtained from strength and polarity of the fluctuation component.
[claim2]
2. The dynamic mode AFM apparatus according to claim 1, wherein the probe-sample distance is automatically controlled so that the inclination of the resonance frequency against the probe-sample distance becomes zero.
[claim3]
3. The dynamic mode AFM apparatus according to claim 2, wherein a frequency in a mode with flexural vibration of a lower order is used as the second frequency, that is different from the frequency in the mode with flexural vibration.
[claim4]
4. The dynamic mode AFM apparatus according to claim 3, wherein a self-excited oscillation circuit which oscillates at the resonance frequency in the mode is configured as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and frequency detection is used as the means for detecting the fluctuation of the resonance frequency.
[claim5]
5. The dynamic mode AFM apparatus according to claim 3, wherein a self-excited oscillation circuit which oscillates at the resonance frequency in the mode is configured as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and phase detection is used as the means for detecting the fluctuation of the resonance frequency.
[claim6]
6. The dynamic mode AFM apparatus according to claim 3, wherein a signal source to generate an AC signal of a frequency that is a constant frequency around the resonance frequency of the mode or that is controlled to slowly follow the resonance frequency of the mode is used as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and the means for detecting the fluctuation of the resonance frequency is configured by detecting a phase of displacement or speed of the cantilever against the signal.
[claim7]
7. The dynamic mode AFM apparatus according to claim 2, wherein a self-excited oscillation circuit which oscillates at the resonance frequency in the mode is configured as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and frequency detection is used as the means for detecting the fluctuation of the resonance frequency.
[claim8]
8. The dynamic mode AFM apparatus according to claim 2, wherein a self-excited oscillation circuit which oscillates at the resonance frequency in the mode is configured as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and phase detection is used as the means for detecting the fluctuation of the resonance frequency.
[claim9]
9. The dynamic mode AFM apparatus according to claim 2, wherein a signal source to generate an AC signal of a frequency that is a constant frequency around the resonance frequency of the mode or that is controlled to slowly follow the resonance frequency of the mode is used as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and the means for detecting the fluctuation of the resonance frequency is configured by detecting a phase of displacement or speed of the cantilever against the signal.
[claim10]
10. The dynamic mode AFM apparatus according to claim 1, wherein a frequency in a mode with flexural vibration of a lower order is used as the second frequency, that is different from the frequency in the mode with flexural vibration.
[claim11]
11. The dynamic mode AFM apparatus according to claim 10, wherein a self-excited oscillation circuit which oscillates at the resonance frequency in the mode is configured as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and frequency detection is used as the means for detecting the fluctuation of the resonance frequency.
[claim12]
12. The dynamic mode AFM apparatus according to claim 10, wherein a self-excited oscillation circuit which oscillates at the resonance frequency in the mode is configured as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and phase detection is used as the means for detecting the fluctuation of the resonance frequency.
[claim13]
13. The dynamic mode AFM apparatus according to claim 10, wherein a signal source to generate an AC signal of a frequency that is a constant frequency around the resonance frequency of the mode or that is controlled to slowly follow the resonance frequency of the mode is used as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and the means for detecting the fluctuation of the resonance frequency is configured by detecting a phase of displacement or speed of the cantilever against the signal.
[claim14]
14. The dynamic mode AFM apparatus according to claim 1, wherein a self-excited oscillation circuit which oscillates at the resonance frequency in the mode is configured as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and frequency detection is used as the means for detecting the fluctuation of the resonance frequency.
[claim15]
15. The dynamic mode AFM apparatus according to claim 1, wherein a self-excited oscillation circuit which oscillates at the resonance frequency in the mode is configured as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and phase detection is used as the means for detecting the fluctuation of the resonance frequency.
[claim16]
16. The dynamic mode AFM apparatus according to claim 1, wherein a signal source to generate an AC signal of a frequency that is a constant frequency around the resonance frequency of the mode or that is controlled to slowly follow the resonance frequency of the mode is used as the means for generating the AC signal of the resonance frequency in the mode with flexural vibration of the cantilever, and the means for detecting the fluctuation of the resonance frequency is configured by detecting a phase of displacement or speed of the cantilever against the signal.
  • Inventor, and Inventor/Applicant
  • KAWAKATSU HIDEKI
  • KOBAYASHI DAI
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY
IPC(International Patent Classification)
Reference ( R and D project ) CREST Nano Factory and Process Monitoring for Advanced Information Processing and Communication AREA
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