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Ionization method and apparatus with probe, and analytical method and apparatus

Foreign code F110005749
File No. P08-029EP
Posted date Sep 13, 2011
Country EPO
Application number 09822096
Gazette No. 2352022
Gazette No. 2352022
Date of filing Oct 19, 2009
Gazette Date Aug 3, 2011
Gazette Date Mar 9, 2016
International application number JP2009068294
International publication number WO2010047399
Date of international filing Oct 19, 2009
Date of international publication Apr 29, 2010
Priority data
  • 2009JP068294 (Oct 19, 2009) WO
  • P2008-271954 (Oct 22, 2008) JP
Title Ionization method and apparatus with probe, and analytical method and apparatus
Abstract The tip of an electrically conductive probe 11 is brought into contact with a sample and captures the sample S under atmospheric pressure, a high voltage for electrospray is applied to the probe 11 while a solvent is supplied to the tip of the probe 11 that has captured the sample, and molecules of the sample S at the probe tip are ionized.
A miniscule amount of a fine solvent droplet is supplied to the probe tip and slow electrospray is implemented.
As a result, the size of the electrically charged droplet can be made extremely small and components within the sample can be analyzed extensively without selectivity.
Further, in imaging over an extended period of time, electrospray is possible even in the event that the sample dries.
Scope of claims [claim1]
1. An ionization method comprising: bringing the tip of an electrically conductive probe (11) into contact with a sample (S) on a stage (21) and capturing a portion of the sample (S); subsequently moving said probe (11) in a direction in which it separates from the sample (S) on said stage (21); and supplying a solvent to the tip of said probe (11) that has captured the portion of the sample (S) and separated from the sample (S) on said stage (21), and applying a high-voltage for electrospray to said probe (11), thereby ionizing molecules of the sample (S) at the tip of said probe (11), characterized in that said solvent is heated and is supplied as a vapor to the tip of said probe (11).
[claim2]
2. An ionization method according to claim 1, wherein said probe (11) is made to approach in the direction of the sample (S), said probe (11) is brought into contact with the sample surface and is made to penetrate a prescribed depth into the sample (S) where said probe (11) contacted the sample surface.
[claim3]
3. An ionization method according to claim 1 or 2, wherein the surface of said probe tip is chemically modified by molecules that capture a desired compound before the sample (S) is captured.
[claim4]
4. An ionization method according to any one of claims 1 to 3, wherein the vicinity of the tip of said probe (11) at a position separated from the sample (S) is irradiated with laser light to thereby promote ionization of the sample.
[claim5]
5. An ionization analyzing method, the method comprising the steps of: ionizing molecules by the ionization method set forth in any one of claims 1 to 4; and analyzing the ionized molecules.
[claim6]
6. An ionization apparatus comprising: a probe (11); a sample stage (21) adapted to hold a sample (S); a displacing unit (12, 22) adapted to move at least one of the probe (11) and sample stage (21) in a direction in which these approach and separate from each other; a power supply unit (41) adapted to apply a high voltage to the probe (11) at a position where at least the tip of the probe (11) is spaced away from the sample stage (21); and a solvent supply unit (31) adapted to supply a solvent to the tip of the probe (11) at a position where at least the tip of the probe (11) is spaced away from the sample stage (21), characterized in that said solvent is heated by a heating unit (34) and is supplied as a vapor to the tip of the probe (11).
[claim7]
7. An ionization apparatus according to claim 6, further comprising a contact detecting unit (45) adapted to detect that the probe tip has contacted the surface of the sample (S) on the sample stage (21);
wherein said displacing unit (12, 22) is adapted to cause the probe (11) to approach relatively in the direction of the sample stage (21) and, when the fact that the probe tip has contacted the surface of the sample (S) on the stage (21) is detected by said contact detecting unit (45), to displace the probe (11) from the detected position so as to cause the probe (11) to penetrate a prescribed depth into the sample (S).
[claim8]
8. An ionization analysis apparatus having the ionization apparatus set forth in claim 6 or 7 and an analytical apparatus (50) adapted to analyze ionized molecules.
  • Applicant
  • UNIVERSITY OF YAMANASHI
  • Inventor
  • HIRAOKA KENZO
IPC(International Patent Classification)
U.S. Cl./(Sub)
  • H01J049/04S
  • H01J049/16E
Specified countries Contracting States: AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR
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