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DUST MEASURING METHOD AND DUST MEASURING DEVICE

Foreign code F120006286
Posted date Mar 8, 2012
Country WIPO
International application number 2007JP001210
International publication number WO 2008/056444
Date of international filing Nov 6, 2007
Date of international publication May 15, 2008
Priority data
  • P2006-299946 (Nov 6, 2006) JP
Title DUST MEASURING METHOD AND DUST MEASURING DEVICE
Abstract The dust concentration in, e.g., a tunnel is simply measured by means of a portable imager. When the space in a tunnel is imaged by using a strobe of a digital camera, the flash from the strobe is reflected by particles floating in the air. The reflected light is captured and a white-spot image is captured. By counting the white spots, the dust concentration can be estimated. The dust measuring device comprises image extracting means for extracting white spots in an image, area calculating means for calculating the area of the white spots of the image, comparing means for judging whether or not the value calculated by the area calculating means is within a preset region, means for counting the number of the white spots in the preset region, and display means for displaying the count result.
Scope of claims (In Japanese)
【請求項1】空間に閃光を発して空間を撮影し、撮影画像中に存在する白斑画像の数をカウントする粉塵測定方法。

【請求項2】請求項1において、背景を黒色として撮影する粉塵測定方法。

【請求項3】請求項1において、撮影装置の焦点距離を50mm以下として撮影する粉塵測定方法。

【請求項4】画像中の白斑画像を抽出する画像抽出手段、白斑画像の面積を計算する面積計算手段、及び面積計算手段で得られた数値が設定範囲内にあるかを判定する比較手段、設定範囲内の白斑画像の数をカウントする手段、及びカウント結果を表示する表示手段とからなる粉塵測定装置。
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • YAMAGUCHI UNIVERSITY
  • Inventor
  • SHINJI, Masato
IPC(International Patent Classification)
Specified countries AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH,BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO,DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH,GM,GT,HN,HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM,PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,SV,SY,TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN,ZA,ZM,ZW,EP(AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HU,IE,IS,IT,LT,LU,LV,MC,MT,NL,PL,PT,RO,SE,SI,SK,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW,GH,GM,KE,LS,MW,MZ,NA,SD,SL,SZ,TZ,UG,ZM,ZW),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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