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BRAIN SIGNAL MEASUREMENT SYSTEM, IN VIVO MEASUREMENT DEVICE, AND BRAIN SIGNAL MEASUREMENT POSITION CONTROL METHOD

Foreign code F120006374
File No. S2010-0277-C0
Posted date Mar 27, 2012
Country WIPO
International application number 2011JP051237
International publication number WO 2011/090199
Date of international filing Jan 24, 2011
Date of international publication Jul 28, 2011
Priority data
  • P2010-013482 (Jan 25, 2010) JP
Title BRAIN SIGNAL MEASUREMENT SYSTEM, IN VIVO MEASUREMENT DEVICE, AND BRAIN SIGNAL MEASUREMENT POSITION CONTROL METHOD
Abstract Disclosed is a brain signal measurement system in which multiple measurement means for measuring signals are placed in the body by minimally invasive surgery, and wherein the positioning of each measurement means is easily adjustable. A brain signal measurement device (21) has multiple sensors (27) for measuring brain signals placed between the dura and the arachnoid, and holding units (25) which hold the sensors (27). The sensors (27) are connected by means of shape-memory units which have shape-memory properties and which are covered by a thermoelectric insulator. The sensors (27) are inserted using an insertion tube (23) through a hole passing through the scalp, scull and dura, and are inserted between the dura and the arachnoid. In practice, this hole may have a diameter of 1cm or less. the positions of the sensors (27) are changed and subdural placement of the electrodes is made possible with minimally invasive surgery by means of the shape-memory portion of the holding units (25) assuming the form of a memory-treated regular hexagon by means of electrical heating by a power source (29).
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • Kyushu Institute of Technology
  • Inventor
  • YAMAKAWA Toshitaka
  • YAMAKAWA Takeshi
IPC(International Patent Classification)
Specified countries AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA,BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW,BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY-INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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