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SIGNAL REPRODUCING APPARATUS

外国特許コード F120006691
整理番号 S2010-0084
掲載日 2012年5月24日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2010JP071161
国際公開番号 WO 2011065500
国際出願日 平成22年11月26日(2010.11.26)
国際公開日 平成23年6月3日(2011.6.3)
優先権データ
  • 特願2009-271659 (2009.11.30) JP
発明の名称 (英語) SIGNAL REPRODUCING APPARATUS
発明の概要(英語) Provided is a signal reproducing apparatus capable of stably obtaining a good response characteristic even when the amplitude or offset of an input signal varies. The signal reproducing apparatus (1) comprises: a plurality of FETs (61-6N) the gate terminals of which receive a common input signal (VIN) and to the drain terminals of which a bias voltage (VDD) is applied; and an adder circuit (4) that is connected to the source terminals of the plurality of FETs (61-6N) and that combines and outputs the currents flowing between the respective drain and source terminals of the plurality of FETs (61-6N). The plurality of FETs (61-6N) are adapted such that when the bias voltage (VDD) having the same value is applied, the FETs (61-6N) will have different threshold voltages with respect to the applied voltages of the gate terminals of the FETs (61-6N).
従来技術、競合技術の概要(英語) BACKGROUND ART
From the prior art, noise is added when performing the detection of micro-electrical signal, using a filter which removes frequency components including noise components and a method, an input signal to attenuate the noise averaging technique and the like have been adopted. In addition, in the following Patent Document 1 as described, power spectrum analysis and statistical analysis by repeating data processing such as, detection of a small signal due to noise has been proposed a technique of performing.
In addition, as described in the following Patent Document 2, the gate terminal of the plurality of FET is applied to the input signal, the drain - source current generated can be synthesized and output, the probability expression of the resonance phenomenon to improve the detection sensitivity is also contemplated that the device has been started.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • HOKKAIDO UNIVERSITY
  • 発明者(英語)
  • KASAI Seiya
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IS JP KE KG KM KN KP KR KZ LA LC LK LR LS LT LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PE PG PH PL PT RO RS RU SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ MD RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW ML MR NE SN TD TG
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