PRETREATMENT DEVICE FOR ANALYSIS OF DISSOLVED ION, DISSOLVED ION ANALYSIS SYSTEM, AND PRETREATMENT METHOD FOR ANALYSIS OF DISSOLVED ION
Foreign code | F120006777 |
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File No. | S2011-0081 |
Posted date | Jun 20, 2012 |
Country | WIPO |
International application number | 2011JP069567 |
International publication number | WO 2012/073566 |
Date of international filing | Aug 30, 2011 |
Date of international publication | Jun 7, 2012 |
Priority data |
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Title |
PRETREATMENT DEVICE FOR ANALYSIS OF DISSOLVED ION, DISSOLVED ION ANALYSIS SYSTEM, AND PRETREATMENT METHOD FOR ANALYSIS OF DISSOLVED ION
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Abstract | Provided is a pretreatment device for use in the analysis of a dissolved ion, which enables the separation of a dissolved ion to be analyzed from a sample solution within a short time and which is applicable to both a case in which the dissolved ion to be measured is a cation and a case in which the dissolved ion to be measured is an anion. A pretreatment device (10) for use in the analysis of a dissolved ion, which comprises: a sample solution flow path (11) through which a sample solution containing the dissolved ion to be measured flows; an extracted solution flow path (13) which is arranged adjacent to the sample solution flow path (11) so as to intercalate a dialysis membrane (12) between the extracted solution flow path (13) and the sample solution flow path (11); a pair of electrodes (14a, 14b) which are so arranged as to intercalate the sample solution flow path (11) and the extracted solution flow path (13) therebetween; and a direct current power source (5) which enables the generation of a predetermined potential difference between the electrodes (14a, 14b). When the pretreatment device (10) is used, it becomes possible to separate a dissolved ion to be analyzed from a sample solution within a short time, and the device (10) is effective for a pretreatment in the analysis of an ion, such as an ion chromatography method, an ICP emission spectrometry method, an atomic absorption spectrometry method and a mass spectrometry method. |
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IPC(International Patent Classification) |
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Specified countries | AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL CERTIFICATE),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),QA,RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM) |
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