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PRETREATMENT DEVICE FOR ANALYSIS OF DISSOLVED ION, DISSOLVED ION ANALYSIS SYSTEM, AND PRETREATMENT METHOD FOR ANALYSIS OF DISSOLVED ION meetings

Foreign code F120006777
File No. S2011-0081
Posted date Jun 20, 2012
Country WIPO
International application number 2011JP069567
International publication number WO 2012/073566
Date of international filing Aug 30, 2011
Date of international publication Jun 7, 2012
Priority data
  • P2010-268404 (Dec 1, 2010) JP
Title PRETREATMENT DEVICE FOR ANALYSIS OF DISSOLVED ION, DISSOLVED ION ANALYSIS SYSTEM, AND PRETREATMENT METHOD FOR ANALYSIS OF DISSOLVED ION meetings
Abstract Provided is a pretreatment device for use in the analysis of a dissolved ion, which enables the separation of a dissolved ion to be analyzed from a sample solution within a short time and which is applicable to both a case in which the dissolved ion to be measured is a cation and a case in which the dissolved ion to be measured is an anion. A pretreatment device (10) for use in the analysis of a dissolved ion, which comprises: a sample solution flow path (11) through which a sample solution containing the dissolved ion to be measured flows; an extracted solution flow path (13) which is arranged adjacent to the sample solution flow path (11) so as to intercalate a dialysis membrane (12) between the extracted solution flow path (13) and the sample solution flow path (11); a pair of electrodes (14a, 14b) which are so arranged as to intercalate the sample solution flow path (11) and the extracted solution flow path (13) therebetween; and a direct current power source (5) which enables the generation of a predetermined potential difference between the electrodes (14a, 14b). When the pretreatment device (10) is used, it becomes possible to separate a dissolved ion to be analyzed from a sample solution within a short time, and the device (10) is effective for a pretreatment in the analysis of an ion, such as an ion chromatography method, an ICP emission spectrometry method, an atomic absorption spectrometry method and a mass spectrometry method.
  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • NATIONAL UNIVERSITY CORPORATION KUMAMOTO UNIVERSITY
  • Inventor
  • OHIRA, Shinichi
  • TODA, Kei
  • DASGUPTA, PURNENDU K.
IPC(International Patent Classification)
Specified countries AE(UTILITY MODEL),AG,AL(UTILITY MODEL),AM(PROVISIONAL PATENT)(UTILITY MODEL),AO(UTILITY MODEL),AT(UTILITY MODEL),AU,AZ(UTILITY MODEL),BA(CONSENSUAL PATENT),BB,BG(UTILITY MODEL),BH(UTILITY MODEL),BR(UTILITY MODEL),BW(UTILITY MODEL CERTIFICATE),BY(UTILITY MODEL),BZ(UTILITY MODEL),CA,CH,CL(UTILITY MODEL),CN(UTILITY MODEL),CO(UTILITY MODEL),CR(UTILITY MODEL),CU(INVENTOR'S CERTIFICATE),CZ(UTILITY MODEL),DE(UTILITY MODEL),DK(UTILITY MODEL),DM,DO(UTILITY MODEL),DZ,EC(UTILITY MODEL),EE(UTILITY MODEL),EG(UTILITY MODEL),ES(UTILITY MODEL),FI(UTILITY MODEL),GB,GD,GE(UTILITY MODEL),GH(UTILITY CERTIFICATE),GM,GT(UTILITY MODEL),HN(UTILITY MODEL),HR(CONSENSUAL PATENT),HU(UTILITY MODEL),ID,IL,IN,IS,JP(UTILITY MODEL),KE(UTILITY MODEL),KG(UTILITY MODEL),KM,KN,KP(INVENTOR'S CERTIFICATE)(UTILITY MODEL),KR(UTILITY MODEL),KZ(PROVISIONAL PATENT)(UTILITY MODEL),LA,LC,LK,LR,LS(UTILITY MODEL),LT,LU,LY,MA,MD(UTILITY MODEL),ME,MG,MK,MN,MW,MX(UTILITY MODEL),MY(UTILITY INNOVATION),MZ(UTILITY MODEL),NA,NG,NI(UTILITY MODEL),NO,NZ,OM(UTILITY MODEL),PE(UTILITY MODEL),PG,PH(UTILITY MODEL),PL(UTILITY MODEL),PT(UTILITY MODEL),QA,RO,RS(PETTY PATENT),RU(UTILITY MODEL),SC,SD,SE,SG,SK(UTILITY MODEL),SL(UTILITY MODEL),SM,ST,SV(UTILITY MODEL),SY,TH(PETTY PATENT),TJ(UTILITY MODEL),TM(PROVISIONAL PATENT),TN,TR(UTILITY MODEL),TT(UTILITY CERTIFICATE),TZ,UA(UTILITY MODEL),UG(UTILITY CERTIFICATE),US,UZ(UTILITY MODEL),VC(UTILITY CERTIFICATE),VN(PATENT FOR UTILITY SOLUTION),ZA,ZM,ZW,EP(AL,AT,BE,BG,CH,CY,CZ,DE,DK,EE,ES,FI,FR,GB,GR,HR,HU,IE,IS,IT,LT,LU,LV,MC,MK,MT,NL,NO,PL,PT,RO,RS,SE,SI,SK,SM,TR),OA(BF(UTILITY MODEL),BJ(UTILITY MODEL),CF(UTILITY MODEL),CG(UTILITY MODEL),CI(UTILITY MODEL),CM(UTILITY MODEL),GA(UTILITY MODEL),GN(UTILITY MODEL),GQ(UTILITY MODEL),GW(UTILITY MODEL),ML(UTILITY MODEL),MR(UTILITY MODEL),NE(UTILITY MODEL),SN(UTILITY MODEL),TD(UTILITY MODEL),TG(UTILITY MODEL)),AP(BW(UTILITY MODEL),GH(UTILITY MODEL),GM(UTILITY MODEL),KE(UTILITY MODEL),LR(UTILITY MODEL),LS(UTILITY MODEL),MW(UTILITY MODEL),MZ(UTILITY MODEL),NA(UTILITY MODEL),SD(UTILITY MODEL),SL(UTILITY MODEL),SZ(UTILITY MODEL),TZ(UTILITY MODEL),UG(UTILITY MODEL),ZM(UTILITY MODEL),ZW(UTILITY MODEL)),EA(AM,AZ,BY,KG,KZ,MD,RU,TJ,TM)
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