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METHOD FOR TESTING FOR PSYCHIATRIC DISORDER, TEST KIT FOR PSYCHIATRIC DISORDER, AND METHOD FOR EVALUATING THERAPEUTIC AGENT AND/OR PREVENTION AGENT FOR PSYCHIATRIC DISORDER meetings

Foreign code F120006860
File No. S2010-1052-C0
Posted date Sep 20, 2012
Country WIPO
International application number 2011JP067004
International publication number WO 2012/017867
Date of international filing Jul 26, 2011
Date of international publication Feb 9, 2012
Priority data
  • P2010-175748 (Aug 4, 2010) JP
Title METHOD FOR TESTING FOR PSYCHIATRIC DISORDER, TEST KIT FOR PSYCHIATRIC DISORDER, AND METHOD FOR EVALUATING THERAPEUTIC AGENT AND/OR PREVENTION AGENT FOR PSYCHIATRIC DISORDER meetings
Abstract

Provided are: a method for testing for a psychiatric disorder by means of an objective determination standard based on a biological indicator through a technique that has a single gene as a subject

an test kit for a psychiatric disorder

and a method for evaluating a therapeutic agent and/or prevention agent for a psychiatric disorder. This method for testing for a psychiatric disorder includes: a detection step for detecting the methylation state at a CpG island upstream from an exon I of the BDNF gene in a sample collected from a subject

and an testing step for comparing the methylation state of the sample and the methylation state of the CpG island upstream from the exon I of the BDNF gene in a sample collected from an individual with the psychiatric disorder and an individual without the psychiatric disorder, thus testing whether or not the subject has the psychiatric disorder. Preferably, the psychiatric disorder is depression and/or schizophrenia.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • HIROSHIMA UNIVERSITY,
  • MORINOBU SHIGERU,
  • FUCHIKAMI MANABU
  • Inventor
  • MORINOBU SHIGERU,
  • FUCHIKAMI MANABU
IPC(International Patent Classification)

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