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Ionization method and apparatus using a probe, and analytical method and apparatus

外国特許コード F120006901
整理番号 P08-029US
掲載日 2012年10月4日
出願国 アメリカ合衆国
出願番号 200913125437
公報番号 20110198495
公報番号 8450682
出願日 平成21年10月19日(2009.10.19)
公報発行日 平成23年8月18日(2011.8.18)
公報発行日 平成25年5月28日(2013.5.28)
国際出願番号 JP2009068294
国際公開番号 WO2010047399
国際出願日 平成21年10月19日(2009.10.19)
国際公開日 平成22年4月29日(2010.4.29)
優先権データ
  • 特願2008-271954 (2008.10.22) JP
  • 2009WO-JP68294 (2009.10.19) WO
発明の名称 (英語) Ionization method and apparatus using a probe, and analytical method and apparatus
発明の概要(英語) (US8450682)
The tip of an electrically conductive probe 11 is brought into contact with a sample and captures the sample S under atmospheric pressure, a high voltage for electrospray is applied to the probe 11 while a solvent is supplied to the tip of the probe 11 that has captured the sample, and molecules of the sample S at the probe tip are ionized.
A miniscule amount of a fine solvent droplet is supplied to the probe tip and slow electrospray is implemented.
As a result, the size of the electrically charged droplet can be made extremely small and components within the sample can be analyzed extensively without selectivity.
Further, in imaging over an extended period of time, electrospray is possible even in the event that the sample dries.
特許請求の範囲(英語) [claim1]
1. An ionization method comprising: bringing a tip of an electrically conductive probe into contact with a sample on a stage and capturing a portion of the sample;
subsequently moving said probe in a direction in which it separates from the sample on said stage; and
supplying a vapor of a heated solvent to the tip of said probe that has captured the portion of the sample and separated from the sample on said stage, and applying a high-voltage for electrospray to said probe, thereby ionizing molecules of the sample at the tip of said probe.
[claim2]
2. An ionization method according to claim 1, wherein said probe is made to approach in the direction of the sample, said probe is brought into contact with the sample surface and is made to penetrate a prescribed depth into the sample where said probe contacted the sample surface.
[claim3]
3. An ionization method according to claim 1, wherein a surface of said probe tip is chemically modified by molecules that capture a desired compound before the sample is captured.
[claim4]
4. An ionization method according to claim 1, wherein a vicinity of the tip of said probe at a position separated from the sample is irradiated with laser light to thereby promote ionization of the sample.
[claim5]
5. An ionization analyzing method of analyzing molecules that have been ionized by the ionization method set forth in claim 1.
[claim6]
6. An ionization apparatus comprising: a probe;
a sample stage for holding a sample;
a displacing unit for moving at least one of the probe and sample stage in a direction in which these approach and separate from each other;
a power supply unit for applying a high voltage to the probe at a position where at least a tip of the probe is spaced away from the sample stage; and
a solvent supply unit for supplying a vapor of a solvent heated by a heating unit to the tip of the probe at a position where at least the tip of the probe is spaced away from the sample stage.
[claim7]
7. An ionization apparatus according to claim 6, further comprising a contact detecting unit for detecting that the probe tip has contacted a surface of the sample on the sample stage; wherein said displacing unit causes the probe to approach relatively in the direction of the sample stage and, when the fact that the probe tip has contacted the surface of the sample on the stage is detected by said contact detecting unit, displaces the probe from the detected position so as to cause the probe to penetrate a prescribed depth into the sample.
[claim8]
8. An ionization analysis apparatus having the ionization apparatus set forth in claim 6 and an analytical apparatus for analyzing ionized molecules.
[claim9]
9. An ionization method comprising: bringing a tip of an electrically conductive probe into contact with a sample and capturing a portion of the sample;
subsequently cooling in vacuo at least the tip portion of said probe, which has captured the portion of the sample; and
spraying a solvent vapor heated by a heating unit toward the cooled tip of said probe and applying a high voltage for electrospray to said probe, thereby ionizing molecules of the sample at the tip of said probe.
[claim10]
10. An ionization analyzing method of analyzing molecules that have been ionized by the ionization method set forth in claim 9.
[claim11]
11. An ionization method comprising: coating a surface of a tip of an electrically conductive probe with a matrix;
bringing said probe tip coated with the matrix into contact with a sample and capturing the sample; and
irradiating the tip of said probe, which has captured the sample, with laser light of a wavelength absorbed by said matrix and applying a high voltage for electrospray to said probe to thereby desorb and ionize molecules of the sample at the tip of said probe.
[claim12]
12. An ionization analyzing method of analyzing molecules that have been ionized by the ionization method set forth in claim 11.
[claim13]
13. An ionization method comprising: causing a tip of an electrically conductive probe to approach in the direction of a sample on a stage, bringing said probe tip into contact with a sample surface, causing said probe tip to penetrate a prescribed depth into the sample where said probe tip contacted the sample surface and capturing a portion of the sample on the stage;
subsequently moving said probe in a direction in which it separates from the sample on said stage; and
supplying a solvent vapor heated by a heating unit to the tip of said probe that has captured the portion of the sample and separated from the sample on said stage, and applying a high-voltage for electrospray to said probe, thereby ionizing molecules of the sample at the tip of said probe.
[claim14]
14. An ionization analyzing method of analyzing molecules that have been ionized by the ionization method set forth in claim 13.
[claim15]
15. An ionization apparatus comprising: a probe;
a sample stage for holding a sample;
a displacing unit for moving at least one of the probe and sample stage in a direction in which these approach and separate from each other;
a power supply unit for applying a high voltage to the probe at a position where at least a tip of the probe is spaced away from the sample stage;
a solvent supply unit for supplying a solvent to the tip of the probe at a position where at least the tip of the probe is spaced away from the sample stage; and
a contact detecting unit for detecting that the probe tip has contacted a surface of the sample on the sample stage;
wherein said displacing unit causes the probe to approach relatively in the direction of the sample stage and, when the fact that the probe tip has contacted the surface of the sample on the stage is detected by said contact detecting unit, displaces the probe from the detected position so as to cause the probe to penetrate a prescribed depth into the sample.
[claim16]
16. An ionization analysis apparatus having the ionization apparatus set forth in claim 15 and an analytical apparatus for analyzing ionized molecules.
[claim17]
17. An ionization method comprising: causing a tip of an electrically conductive probe to approach in the direction of a sample on a stage, bringing said probe tip into contact with a sample surface, causing said probe tip to penetrate a prescribed depth into the sample where said probe tip contacted the sample surface and capturing a portion of the sample on the stage;
subsequently moving said probe in a direction in which it separates from the sample on said stage; and
supplying a solvent vapor heated by a heating unit to the tip of said probe that has captured the portion of the sample and separated from the sample on said stage, and applying a high voltage for electrospray to said probe, thereby ionizing molecules of the sample at the tip of said probe.
[claim18]
18. An ionization analyzing method of analyzing molecules that have been ionized by the ionization method set forth in claim 17.
[claim19]
19. An ionization apparatus comprising: a probe;
a sample stage for holding a sample;
a displacing unit for moving at least one of the probe and sample stage in a direction in which these approach and separate from each other;
a power supply unit for applying a high voltage to the probe at a position where at least a tip of the probe is spaced away from the sample stage; and
a contact detecting unit for detecting that the probe tip has contacted a surface of the sample on the sample stage;
wherein said displacing unit causes the probe to approach relatively in the direction of the sample stage and, when the fact that the probe tip has contacted the surface of the sample on the stage is detected by said contact detecting unit, displaces the probe from the detected position so as to cause the probe to penetrate a prescribed depth into the sample.
[claim20]
20. An ionization analysis apparatus having the ionization apparatus set forth in claim 19 and an analytical apparatus for analyzing ionized molecules.
  • 発明者/出願人(英語)
  • HIRAOKA KENZO
  • UNIVERSITY OF YAMANASHI
国際特許分類(IPC)
米国特許分類/主・副
  • H01J049/04S
  • H01J049/16E
上記の特許・技術に関心のある方は、下記問合せ先にご相談下さい。

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