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FINGER ARTERY ELASTICITY MEASURING PROGRAM, FINGER ARTERY ELASTICITY MEASURING DEVICE, AND FINGER ARTERY ELASTICITY MEASURING METHOD

Foreign code F120006935
File No. S2007-0435-C0
Posted date Oct 12, 2012
Country WIPO
International application number 2008JP052232
International publication number WO 2008/105229
Date of international filing Feb 12, 2008
Date of international publication Sep 4, 2008
Priority data
  • P2007-048652 (Feb 28, 2007) JP
Title FINGER ARTERY ELASTICITY MEASURING PROGRAM, FINGER ARTERY ELASTICITY MEASURING DEVICE, AND FINGER ARTERY ELASTICITY MEASURING METHOD
Abstract

[PROBLEMS TO BE SOLVED] A finger artery elasticity measuring program, a finger artery elasticity measuring device and a finger artery elasticity measuring method are provided for making it possible to measure an elasticity index of a finger artery in accordance with a pulse wave of a finger artery without measuring a blood pressure in evaluating the elasticity of the finger artery related to the degree of arterial sclerosis. [MEANS FOR SOLVING THE PROBLEMS] A finger artery elasticity measuring device is comprised of a pulse wave memory unit (42), a cuff pressure data memory unit (43), an NPV calculating unit (52) for dividing an amplitude (?I) of an alternate component of a pulse wave by an average value of direct components (I) to calculate a normalized pulse wave volume, a relative cuff pressure calculating unit (53) for calculating a difference between a cuff pressure at the maximum amplitude of the pulse wave and each cuff value as a relative cuff pressure (Pr), an FEI calculating unit (54) for calculating a linear recursive slope (n) of the following equation (1) as an elasticity index of the finger artery: In(NPV) = In(bn)-n Pr ... (1) where b is a constant, so as to make a computer function.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • SAPPORO MEDICAL UNIVERSITY,
  • TANAKA, GOHICHI,
  • SAWADA, YUKIHIRO
  • Inventor
  • TANAKA, GOHICHI,
  • SAWADA, YUKIHIRO
IPC(International Patent Classification)

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