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Disclosed is a compound microscope device (1) which is provided with a transmissive electron microscope (2), and an optical microscope (4). On the electron optical axis (C) of an electron beam, a sample (10) and a reflecting mirror (41) are disposed, and the reflecting mirror is tilted from the electron optical axis toward an optical objective lens (43) and the sample. Light, such as fluorescent light, reflected light and the like, which is generated from the sample, is inputted to the optical objective lens by being reflected by the reflecting mirror, and is detected by an optical detecting section (46). The electron beam that has passed through the sample passes through the installation center hole (42) of the reflecting mirror, and is detected by a detecting section (30). Thus, the compound microscope device, whereby the same sample can be observed at the same time by means of the transmissive electron microscope and the optical microscope, is provided.
