EMBEDDING RESIN COMPOSITION FOR ELECTRON MICROSCOPE, AND METHOD FOR OBSERVING SAMPLE ON ELECTRON MICROSCOPE USING SAID COMPOSITION
Provided are: an embedding resin composition for an electron microscope, which has satisfactory performance for use as an embedding agent, including embedding performance and a property of being sliced thin, and can exhibit excellent antistatic performance
and a method for observing a sample on an electron microscope using the composition. This embedding resin composition for an electron microscope comprises an ionic liquid and an embedding agent comprising an epoxy resin, a methacrylic acid resin or an unsaturated polyester resin, and has antistatic performance. It is preferred that the ionic liquid comprises a quaternary ammonium compound represented by formula (I) and an anion selected from the group consisting of BF4 -, PF6 -, (CF3SO2)2N-, a halide ion, a conjugate base of a carboxylic acid, a conjugate base of a sulfonic acid and a conjugate base of an inorganic acid.