ELECTRON-MICROSCOPIC EXAMINATION METHOD FOR EXAMINING BIOSAMPLE WHILE KEEPING SAID BIOSAMPLE UNCHANGED, AND COMPOSITION FOR EVAPORATION INHIBITION UNDER VACUUM, SCANNING ELECTRON MICROSCOPE, AND TRANSMISSION ELECTRON MICROSCOPE FOR USE IN SAID METHOD
外国特許コード | F130007288 |
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整理番号 | AF12P020 |
掲載日 | 2013年4月11日 |
出願国 | 世界知的所有権機関(WIPO) |
国際出願番号 | 2012JP072982 |
国際公開番号 | WO 2013/035866 |
国際出願日 | 平成24年9月7日(2012.9.7) |
国際公開日 | 平成25年3月14日(2013.3.14) |
優先権データ |
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発明の名称 (英語) |
ELECTRON-MICROSCOPIC EXAMINATION METHOD FOR EXAMINING BIOSAMPLE WHILE KEEPING SAID BIOSAMPLE UNCHANGED, AND COMPOSITION FOR EVAPORATION INHIBITION UNDER VACUUM, SCANNING ELECTRON MICROSCOPE, AND TRANSMISSION ELECTRON MICROSCOPE FOR USE IN SAID METHOD
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発明の概要(英語) |
A method for electron-microscopic examination is provided with which it is possible to examine a biosample with an electron microscope while keeping the biosample alive and to observe the biosample being moving. Also provided are a composition for evaporation inhibition under vacuum, a scanning electron microscope, and a transmission electron microscope which are for use in the method. This method for sample examination by electron microscopy is characterized by comprising: a step in which a composition for evaporation inhibition that comprises at least one ingredient selected from amphipathic compounds, oils and fats, and ionic liquids is applied to the surface of a sample to form a thin film and thus cover the sample with the thin film and a step in which an electron-microscopic image of the thin-film-covered sample that has been placed in a vacuum sample chamber is displayed in a display device. |
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国際特許分類(IPC) |
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参考情報 (研究プロジェクト等) | CREST Establishment of Innovative Manufacturing Technology Based on Nanoscience AREA |
日本語項目の表示
発明の名称 |
生物試料をそのままの姿で観察するための電子顕微鏡による観察方法とそれに用いられる真空下での蒸発抑制用組成物、走査型電子顕微鏡および透過型電子顕微鏡
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『 ELECTRON-MICROSCOPIC EXAMINATION METHOD FOR EXAMINING BIOSAMPLE WHILE KEEPING SAID BIOSAMPLE UNCHANGED, AND COMPOSITION FOR EVAPORATION INHIBITION UNDER VACUUM, SCANNING ELECTRON MICROSCOPE, AND TRANSMISSION ELECTRON MICROSCOPE FOR USE IN SAID METHOD 』に関するお問合せ
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