Top > Search of International Patents > ELECTRON-MICROSCOPIC EXAMINATION METHOD FOR EXAMINING BIOSAMPLE WHILE KEEPING SAID BIOSAMPLE UNCHANGED, AND COMPOSITION FOR EVAPORATION INHIBITION UNDER VACUUM, SCANNING ELECTRON MICROSCOPE, AND TRANSMISSION ELECTRON MICROSCOPE FOR USE IN SAID METHOD

ELECTRON-MICROSCOPIC EXAMINATION METHOD FOR EXAMINING BIOSAMPLE WHILE KEEPING SAID BIOSAMPLE UNCHANGED, AND COMPOSITION FOR EVAPORATION INHIBITION UNDER VACUUM, SCANNING ELECTRON MICROSCOPE, AND TRANSMISSION ELECTRON MICROSCOPE FOR USE IN SAID METHOD meetings

Foreign code F130007288
File No. AF12P020
Posted date Apr 11, 2013
Country WIPO
International application number 2012JP072982
International publication number WO 2013/035866
Date of international filing Sep 7, 2012
Date of international publication Mar 14, 2013
Priority data
  • P2011-197685 (Sep 9, 2011) JP
  • P2012-044383 (Feb 29, 2012) JP
Title ELECTRON-MICROSCOPIC EXAMINATION METHOD FOR EXAMINING BIOSAMPLE WHILE KEEPING SAID BIOSAMPLE UNCHANGED, AND COMPOSITION FOR EVAPORATION INHIBITION UNDER VACUUM, SCANNING ELECTRON MICROSCOPE, AND TRANSMISSION ELECTRON MICROSCOPE FOR USE IN SAID METHOD meetings
Abstract

A method for electron-microscopic examination is provided with which it is possible to examine a biosample with an electron microscope while keeping the biosample alive and to observe the biosample being moving. Also provided are a composition for evaporation inhibition under vacuum, a scanning electron microscope, and a transmission electron microscope which are for use in the method. This method for sample examination by electron microscopy is characterized by comprising: a step in which a composition for evaporation inhibition that comprises at least one ingredient selected from amphipathic compounds, oils and fats, and ionic liquids is applied to the surface of a sample to form a thin film and thus cover the sample with the thin film

and a step in which an electron-microscopic image of the thin-film-covered sample that has been placed in a vacuum sample chamber is displayed in a display device.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • JAPAN SCIENCE AND TECHNOLOGY AGENCY,
  • HARIYAMA TAKAHIKO,
  • TAKAKU YASUHARU,
  • SUZUKI HIROSHI,
  • MURANAKA YOSHINORI,
  • OHTA ISAO,
  • SHIMOMURA MASATSUGU,
  • ISHII DAISUKE
  • Inventor
  • HARIYAMA TAKAHIKO,
  • TAKAKU YASUHARU,
  • SUZUKI HIROSHI,
  • MURANAKA YOSHINORI,
  • OHTA ISAO,
  • SHIMOMURA MASATSUGU,
  • ISHII DAISUKE
IPC(International Patent Classification)
Reference ( R and D project ) CREST Establishment of Innovative Manufacturing Technology Based on Nanoscience AREA
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