DC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD
外国特許コード | F130007303 |
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整理番号 | S2011-1084-N0 |
掲載日 | 2013年4月17日 |
出願国 | 世界知的所有権機関(WIPO) |
国際出願番号 | 2012JP074599 |
国際公開番号 | WO 2013/047537 |
国際出願日 | 平成24年9月25日(2012.9.25) |
国際公開日 | 平成25年4月4日(2013.4.4) |
優先権データ |
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発明の名称 (英語) | DC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD |
発明の概要(英語) |
This DC magnetic field magnetic profile measuring device obtains magnetic field distribution images on the surface of an observation sample using magnetic field amplitude and phase data obtained by scanning a scanning region. This magnetic profile measuring device (1) is provided with a cantilever (11), an exciter (12) which excites the cantilever at the resonant frequency or a frequency close thereto, an AC magnetic field generator (13) which frequency-modulates the excitation frequency of the cantilever, a vibration sensor (14) which detects vibration by means of a probe, a demodulation processing device (15) which demodulates the magnetic signal corresponding to the AC magnetic force generated between the probe and the observation sample and detects the amplitude and phase of the magnetic field, a scanning mechanism (16) which scans the scanning region with the probe, a data storage device (17) which stores as initial data the amplitude and phase of the magnetic field at each coordinate of the scanning region, a modified data generator (18) which, from the initial data, generates data with a modified phase, and an image display device (19) which displays a magnetic field distribution image based on the changed data. |
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国際特許分類(IPC) |
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日本語項目の表示
発明の名称 | 磁気プロファイル測定装置および磁気プロファイル測定方法 |
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『 DC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD 』に関するお問合せ
- 国立大学法人秋田大学 産学連携推進機構知的財産部門
- URL: https://www.akita-u.ac.jp/crc/
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E-mail:
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