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DC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD

Foreign code F130007303
File No. S2011-1084-N0
Posted date Apr 17, 2013
Country WIPO
International application number 2012JP074599
International publication number WO 2013/047537
Date of international filing Sep 25, 2012
Date of international publication Apr 4, 2013
Priority data
  • P2011-210008 (Sep 26, 2011) JP
Title DC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD
Abstract

This DC magnetic field magnetic profile measuring device obtains magnetic field distribution images on the surface of an observation sample using magnetic field amplitude and phase data obtained by scanning a scanning region. This magnetic profile measuring device (1) is provided with a cantilever (11), an exciter (12) which excites the cantilever at the resonant frequency or a frequency close thereto, an AC magnetic field generator (13) which frequency-modulates the excitation frequency of the cantilever, a vibration sensor (14) which detects vibration by means of a probe, a demodulation processing device (15) which demodulates the magnetic signal corresponding to the AC magnetic force generated between the probe and the observation sample and detects the amplitude and phase of the magnetic field, a scanning mechanism (16) which scans the scanning region with the probe, a data storage device (17) which stores as initial data the amplitude and phase of the magnetic field at each coordinate of the scanning region, a modified data generator (18) which, from the initial data, generates data with a modified phase, and an image display device (19) which displays a magnetic field distribution image based on the changed data.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • AKITA UNIVERSITY
  • Inventor
  • SAITO HITOSHI,
  • YOSHIMURA SATORU
IPC(International Patent Classification)
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