Top > Search of International Patents > AC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD

AC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD

Foreign code F130007304
File No. S2011-1198-N0
Posted date Apr 17, 2013
Country WIPO
International application number 2012JP074600
International publication number WO 2013/047538
Date of international filing Sep 25, 2012
Date of international publication Apr 4, 2013
Priority data
  • P2011-210009 (Sep 26, 2011) JP
Title AC MAGNETIC FIELD MAGNETIC PROFILE MEASURING DEVICE AND MAGNETIC PROFILE MEASURING METHOD
Abstract

By scanning a space where an AC magnetic field is present, this AC magnetic field magnetic profile measuring device measures the magnetic profile of said space and the magnetic profile of an AC magnetic field generating device. This AC magnetic field magnetic profile measuring device is provided with a cantilever (11) at the end of which a probe is mounted, an exciter (12) which excites at the resonant frequency of the cantilever or a frequency close thereto, a vibration sensor (13) which detects vibration by means of the probe, a demodulation processing device (14) which demodulates the magnetic signal corresponding to the AC magnetic field at the position of the probe and separates the demodulated magnetic signal into the two orthogonal signal components differing in phase by 90 DEG , a scanning mechanism (15)

which scans the space where the demodulated magnetic signal is present with the probe, a data storage device which stores the two orthogonal signal components as initial data with unchanged initial phases, a modified data generator which reads in the initial data stored in the data storage device and generates data in which the phases of the initial data have been modified, and an image display device which displays a magnetic field distribution image.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • AKITA UNIVERSITY
  • Inventor
  • SAITO HITOSHI,
  • YOSHIMURA SATORU
IPC(International Patent Classification)
Please contact us by E-mail or facsimile if you have any interests on this patent.

PAGE TOP

close
close
close
close
close
close