Top > Search of International Patents > SURFACE PLASMON SENSOR AND REFRACTIVE INDEX MEASUREMENT METHOD

SURFACE PLASMON SENSOR AND REFRACTIVE INDEX MEASUREMENT METHOD meetings

Foreign code F130007363
File No. S2011-0683-C0
Posted date May 14, 2013
Country WIPO
International application number 2012JP051707
International publication number WO 2012/102350
Date of international filing Jan 26, 2012
Date of international publication Aug 2, 2012
Priority data
  • P2011-014067 (Jan 26, 2011) JP
Title SURFACE PLASMON SENSOR AND REFRACTIVE INDEX MEASUREMENT METHOD meetings
Abstract

The purpose of the present invention is to measure a refractive index with high accuracy and readily in a surface plasmon sensor for refractive index measurement purposes, without relying on the use of an absorption curve. The surface plasmon sensor is characterized by comprising a reflection board which comprises a metal layer having a periodic structure and has a sample placed thereon, a light source which can emit incident light to the reflection board, a light-receiving unit which can receive reflected light that is reflected on the reflection board, and a measurement unit which can measure a reflective index of the sample on the basis of information on the phases of two different waves that have different polarized directions and are contained in the reflected light from the surface of the periodic structure.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • INSTITUTE OF NATIONAL COLLEGES OF TECHNOLOGY, JAPAN,
  • MATSUDA TOYONORI,
  • ODAGAWA HIROYUKI
  • Inventor
  • MATSUDA TOYONORI,
  • ODAGAWA HIROYUKI
IPC(International Patent Classification)

PAGE TOP

close
close
close
close
close
close