POLARIZED WAVE ANALYZER, POLARIZED WAVE ANALYSIS METHOD, PHYSICAL PROPERTY MEASUREMENT DEVICE, AND PHYSICAL PROPERTY MEASUREMENT METHOD
Provided is a polarized wave analyzer that can measure polarized wave orientation and electric field amplitudes for electromagnetic waves with high speed and high precision. The polarized wave analyzer has: an electromagnetic wave generation source that generates electromagnetic waves
a nonlinear optical crystal that has an electrooptic effect
a rotating mechanism that rotates the crystal relative to the incidence of electromagnetic waves at an angular frequency (omega)
an optical system that makes a probe light pulse incident to the crystal in synchrony with irradiation of the crystal by the electromagnetic waves
a detector that detects an intensity differential signal for light components that are orthogonal to each other out of the probe light pulse that has passed through the crystal
and an analytical unit that extracts at least one of the omega component and the 3omega component from the intensity differential signal and determines the polarized wave orientation and the amplitude of the electromagnetic field for the electromagnetic waves on the basis of the extracted omega component and/or the 3omega component.