Top > Search of International Patents > POLARIZED WAVE ANALYZER, POLARIZED WAVE ANALYSIS METHOD, PHYSICAL PROPERTY MEASUREMENT DEVICE, AND PHYSICAL PROPERTY MEASUREMENT METHOD

POLARIZED WAVE ANALYZER, POLARIZED WAVE ANALYSIS METHOD, PHYSICAL PROPERTY MEASUREMENT DEVICE, AND PHYSICAL PROPERTY MEASUREMENT METHOD

Foreign code F130007400
File No. S2012-0030-N0
Posted date Jun 12, 2013
Country WIPO
International application number 2012JP076146
International publication number WO 2013/077097
Date of international filing Oct 9, 2012
Date of international publication May 30, 2013
Priority data
  • P2011-258104 (Nov 25, 2011) JP
Title POLARIZED WAVE ANALYZER, POLARIZED WAVE ANALYSIS METHOD, PHYSICAL PROPERTY MEASUREMENT DEVICE, AND PHYSICAL PROPERTY MEASUREMENT METHOD
Abstract

Provided is a polarized wave analyzer that can measure polarized wave orientation and electric field amplitudes for electromagnetic waves with high speed and high precision. The polarized wave analyzer has: an electromagnetic wave generation source that generates electromagnetic waves

a nonlinear optical crystal that has an electrooptic effect

a rotating mechanism that rotates the crystal relative to the incidence of electromagnetic waves at an angular frequency (omega)

an optical system that makes a probe light pulse incident to the crystal in synchrony with irradiation of the crystal by the electromagnetic waves

a detector that detects an intensity differential signal for light components that are orthogonal to each other out of the probe light pulse that has passed through the crystal

and an analytical unit that extracts at least one of the omega component and the 3omega component from the intensity differential signal and determines the polarized wave orientation and the amplitude of the electromagnetic field for the electromagnetic waves on the basis of the extracted omega component and/or the 3omega component.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • KEIO UNIVERSITY
  • Inventor
  • WATANABE, SHINICHI,
  • YASUMATSU, NAOYA
IPC(International Patent Classification)
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