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PROBE CARD AND NOISE MEASURING APPARATUS

Foreign code F130007564
Posted date Jul 18, 2013
Country WIPO
International application number 2012JP075407
International publication number WO 2013/051515
Date of international filing Oct 1, 2012
Date of international publication Apr 11, 2013
Priority data
  • P2011-219654 (Oct 3, 2011) JP
Title PROBE CARD AND NOISE MEASURING APPARATUS
Abstract

Provided are a probe card and a noise measuring apparatus that can measure noises in high frequency bands that are higher than several megahertz. There is included a probe (8) that abuts an MOS field effect transistor (14). In a probe card (6A) for measuring noises of the MOS field effect transistor (14), an amplifier circuit (56A) for amplifying an output signal of the MOS field effect transistor (14) is integrally formed.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • UNIVERSITY OF TSUKUBA
  • Inventor
  • OHMORI KENJI,
  • HASUNUMA RYU
IPC(International Patent Classification)
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