PROBE CARD AND NOISE MEASURING APPARATUS
|Posted date||Jul 18, 2013|
|International application number||2012JP075407|
|International publication number||WO 2013/051515|
|Date of international filing||Oct 1, 2012|
|Date of international publication||Apr 11, 2013|
|Title||PROBE CARD AND NOISE MEASURING APPARATUS|
Provided are a probe card and a noise measuring apparatus that can measure noises in high frequency bands that are higher than several megahertz. There is included a probe (8) that abuts an MOS field effect transistor (14). In a probe card (6A) for measuring noises of the MOS field effect transistor (14), an amplifier circuit (56A) for amplifying an output signal of the MOS field effect transistor (14) is integrally formed.
|IPC(International Patent Classification)||
Contact Information for " PROBE CARD AND NOISE MEASURING APPARATUS "
- University of Tsukuba Department of Collaborative Research
- URL: https://www.sanrenhonbu.tsukuba.ac.jp/
- Address: 1-2,Kasuga ,City of Tsukuba ,Ibaraki ,Japan , 305-8550
- Fax: 81-29-859-1693