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METHOD AND DEVICE FOR MEASUREMENT OF UNOCCUPIED ENERGY LEVELS OF SOLID meetings

Foreign code F130007747
Posted date Dec 5, 2013
Country WIPO
International application number 2013JP054952
International publication number WO 2013/129390
Date of international filing Feb 26, 2013
Date of international publication Sep 6, 2013
Priority data
  • P2012-042213 (Feb 28, 2012) JP
Title METHOD AND DEVICE FOR MEASUREMENT OF UNOCCUPIED ENERGY LEVELS OF SOLID meetings
Abstract

While progressively changing the kinetic energy (acceleration energy) of an electron beam within the range of 0-5 eV, spectra are obtained by measuring the intensity of near-ultraviolet and visible light having a wavelength of 180-700nm that is emitted from a solid sample, such as an organic semiconductor, during irradiation with the electron beam. A peak is detected in the spectra, and the energy level thereof is the unoccupied energy level of the sample. In particular, the energy at the rise of the initial peak represents the electron affinity of the sample. Because the energy of the electron beam irradiated onto the sample is less than or equal to 5eV, even organic semiconductor samples will be largely undamaged.

  • Applicant
  • ※All designated countries except for US in the data before July 2012
  • KYOTO UNIVERSITY
  • Inventor
  • YOSHIDA, HIROYUKI
IPC(International Patent Classification)
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