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CHIP FOR ELECTRICAL MEASUREMENT, AND ELECTRICAL MEASURING DEVICE

外国特許コード F160008793
整理番号 (NU-0550)
掲載日 2016年8月4日
出願国 世界知的所有権機関(WIPO)
国際出願番号 2015JP079532
国際公開番号 WO 2016063858
国際出願日 平成27年10月20日(2015.10.20)
国際公開日 平成28年4月28日(2016.4.28)
優先権データ
  • 20140-214090 JP
  • 特願2015-078223 (2015.4.7) JP
発明の名称 (英語) CHIP FOR ELECTRICAL MEASUREMENT, AND ELECTRICAL MEASURING DEVICE
発明の概要(英語) Provided are a chip for electrical measurement, which is designed for high-sensitivity detection by reading not only changes in steady-state current, but the occurrence of transient current as well; and an electrical measurement device that includes the chip for electrical measurement. This chip for electrical measurement includes a substrate, and a sample migration channel and a sample measurement channel which are formed on the substrate. The sample measurement channel includes a first measurement channel that connects to the sample migration channel, and a second measurement channel that connects to the sample migration channel at the opposite side from the first measurement channel.
従来技術、競合技術の概要(英語) BACKGROUND ART
Included in the solution cell, bacteria, pollen, such as PM2.5 sample size, and number can be accurately measured, an important information on healthy lives and, in recent years, increasingly higher measurement accuracy is desired. In addition, in the field of biochemistry, development of a chip for analyzing DNA fragment as it has been desired.
Fig. 1 is, sample size and number and the measuring method of the prior art, is formed on a substrate such as silicon pore (micropore) and passing the sample, by the voltage applied to the pores inside the pores of the cells from the steady current flowing in the magnitude of the change in the amount of, while analyzing a hardness (see Non-Patent Document 1). Fig. 1 a measurement method of the prior art, the smaller the volume of the pores of which are known to be the sensitivity is enhanced. In order to reduce the volume of the pores of the substrate can be shortened and the diameter has to be small, therefore, at a time of measurement as shown in Fig. 1 the substrate is placed vertically has been used.
In addition, the state of the sample to pass through the pores in order to measure more detail, the substrate formed with the micro flow path can be part of a horizontally-pores can be observed under a fluorescence microscope, in addition to measurement of the steady-state current to directly observe the events around the pores of the known method (see Non-Patent Document 2). Fig. 2 is, the Fig. 1 Non-Patent Document 2 is shown.
  • 出願人(英語)
  • ※2012年7月以前掲載分については米国以外のすべての指定国
  • NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
  • OSAKA UNIVERSITY
  • 発明者(英語)
  • BABA YOSHINOBU
  • KAJI NORITADA
  • YASUI TAKAO
  • YASAKI HIROTOSHI
  • SANO MAMIKO
  • KAWAI TOMOJI
  • YANAGIDA TAKESHI
国際特許分類(IPC)
指定国 National States: AE AG AL AM AO AT AU AZ BA BB BG BH BN BR BW BY BZ CA CH CL CN CO CR CU CZ DE DK DM DO DZ EC EE EG ES FI GB GD GE GH GM GT HN HR HU ID IL IN IR IS JP KE KG KN KP KR KZ LA LC LK LR LS LU LY MA MD ME MG MK MN MW MX MY MZ NA NG NI NO NZ OM PA PE PG PH PL PT QA RO RS RU RW SA SC SD SE SG SK SL SM ST SV SY TH TJ TM TN TR TT TZ UA UG US UZ VC VN ZA ZM ZW
ARIPO: BW GH GM KE LR LS MW MZ NA RW SD SL SZ TZ UG ZM ZW
EAPO: AM AZ BY KG KZ RU TJ TM
EPO: AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
OAPI: BF BJ CF CG CI CM GA GN GQ GW KM ML MR NE SN ST TD TG
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